On Sat, Mar 20, 2021 at 03:19:23PM +0800, Zhiqiang Liu wrote:
> From: Zhiqiang Liu
>
> When we make IO stress test on multipath device, there will
> be a metadata err because of wrong path. In the test, we
> concurrent execute 'iscsi device login|logout' and
> 'multipath -r' command with IO stres
Hi Zhiqiang,
Thank you for the patch! Yet something to improve:
[auto build test ERROR on dm/for-next]
[also build test ERROR on mkp-scsi/for-next scsi/for-next v5.12-rc3
next-20210319]
[If your patch is applied to the wrong git tree, kindly drop us a note.
And when submitting patch, we suggest
From: Zhiqiang Liu
When we make IO stress test on multipath device, there will
be a metadata err because of wrong path. In the test, we
concurrent execute 'iscsi device login|logout' and
'multipath -r' command with IO stress on multipath device.
In some case, systemd-udevd may have not time to pr
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