Re: [PATCH v4 16/22] pinctrl: Probe pinctrl devices on demand

2015-09-25 Thread Linus Walleij
On Mon, Sep 7, 2015 at 5:23 AM, Tomeu Vizoso wrote: > When looking up a pin controller through its OF node, probe it if it > hasn't already. > > The goal is to reduce deferred probes to a minimum, as it makes it very > cumbersome to find out why a device failed to probe, and can introduce > very

Re: [PATCH v4 16/22] pinctrl: Probe pinctrl devices on demand

2015-09-25 Thread Linus Walleij
On Mon, Sep 7, 2015 at 5:23 AM, Tomeu Vizoso wrote: > When looking up a pin controller through its OF node, probe it if it > hasn't already. > > The goal is to reduce deferred probes to a minimum, as it makes it very > cumbersome to find out why a device failed to

[PATCH v4 16/22] pinctrl: Probe pinctrl devices on demand

2015-09-07 Thread Tomeu Vizoso
When looking up a pin controller through its OF node, probe it if it hasn't already. The goal is to reduce deferred probes to a minimum, as it makes it very cumbersome to find out why a device failed to probe, and can introduce very big delays in when a critical device is probed. Signed-off-by:

[PATCH v4 16/22] pinctrl: Probe pinctrl devices on demand

2015-09-07 Thread Tomeu Vizoso
When looking up a pin controller through its OF node, probe it if it hasn't already. The goal is to reduce deferred probes to a minimum, as it makes it very cumbersome to find out why a device failed to probe, and can introduce very big delays in when a critical device is probed. Signed-off-by: