On Mon, Sep 7, 2015 at 5:23 AM, Tomeu Vizoso wrote:
> When looking up a pin controller through its OF node, probe it if it
> hasn't already.
>
> The goal is to reduce deferred probes to a minimum, as it makes it very
> cumbersome to find out why a device failed to probe, and can introduce
> very
On Mon, Sep 7, 2015 at 5:23 AM, Tomeu Vizoso wrote:
> When looking up a pin controller through its OF node, probe it if it
> hasn't already.
>
> The goal is to reduce deferred probes to a minimum, as it makes it very
> cumbersome to find out why a device failed to
When looking up a pin controller through its OF node, probe it if it
hasn't already.
The goal is to reduce deferred probes to a minimum, as it makes it very
cumbersome to find out why a device failed to probe, and can introduce
very big delays in when a critical device is probed.
Signed-off-by:
When looking up a pin controller through its OF node, probe it if it
hasn't already.
The goal is to reduce deferred probes to a minimum, as it makes it very
cumbersome to find out why a device failed to probe, and can introduce
very big delays in when a critical device is probed.
Signed-off-by:
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