On Fri, Oct 23, 2020 at 10:07 AM Michael Ellerman wrote:
>
> Po-Hsu Lin writes:
> > The eeh-basic test got its own 60 seconds timeout (defined in commit
> > 414f50434aa2 "selftests/eeh: Bump EEH wait time to 60s") per breakable
> > device.
> >
> > And we have discovered that the number of breakab
Po-Hsu Lin writes:
> The eeh-basic test got its own 60 seconds timeout (defined in commit
> 414f50434aa2 "selftests/eeh: Bump EEH wait time to 60s") per breakable
> device.
>
> And we have discovered that the number of breakable devices varies
> on different hardware. The device recovery time rang
The eeh-basic test got its own 60 seconds timeout (defined in commit
414f50434aa2 "selftests/eeh: Bump EEH wait time to 60s") per breakable
device.
And we have discovered that the number of breakable devices varies
on different hardware. The device recovery time ranges from 0 to 35
seconds. In our