On Fri, 23 Oct 2020 10:45:39 +0800, Po-Hsu Lin wrote:
> The eeh-basic test got its own 60 seconds timeout (defined in commit
> 414f50434aa2 "selftests/eeh: Bump EEH wait time to 60s") per breakable
> device.
>
> And we have discovered that the number of breakable devices varies
> on different hard
Hello,
any update on this patch?
Or do we want to increase the timeout here?
Thanks!
On Fri, Oct 23, 2020 at 10:45 AM Po-Hsu Lin wrote:
>
> The eeh-basic test got its own 60 seconds timeout (defined in commit
> 414f50434aa2 "selftests/eeh: Bump EEH wait time to 60s") per breakable
> device.
>
> A
The eeh-basic test got its own 60 seconds timeout (defined in commit
414f50434aa2 "selftests/eeh: Bump EEH wait time to 60s") per breakable
device.
And we have discovered that the number of breakable devices varies
on different hardware. The device recovery time ranges from 0 to 35
seconds. In our
