smartctl -d sat+megaraid,0 -x /dev/sda
smartctl 6.4 2014-10-07 r4002 [x86_64-linux-3.16.0-4-amd64] (local build)
Copyright (C) 2002-14, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: VK0240GDJXU
Serial Number: BTWL333305ZY240NGN
LU WWN Device Id: 5 5cd2e4 04b4485cc
Firmware Version: 4IWVHPG0
User Capacity: 240.057.409.536 bytes [240 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA8-ACS T13/1699-D revision 4
SATA Version is: SATA 2.6, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Feb 9 18:56:00 2016 EET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
ATA Security is: Unavailable
Write SCT (Get) Feature Control Command failed: ATA return descriptor not
supported by controller firmware
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART Status not supported: ATA return descriptor not supported by controller
firmware
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
Warning: This result is based on an Attribute check.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x03) Offline data collection activity
is in progress.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 64) The previous self-test completed having
a test element that failed and the test
element that failed is not known.
Total time to complete Offline
data collection: ( 2) seconds.
Offline data collection
capabilities: (0x79) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 2) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SCT capabilities: (0x0039) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-- 130 130 039 - 4294967295
5 Reallocated_Sector_Ct PO--CK 095 095 001 - 4
9 Power_On_Hours -O--CK 100 100 000 - 13415
12 Power_Cycle_Count -O--CK 100 100 000 - 42
171 Unknown_Attribute -O--CK 100 100 000 - 2
172 Unknown_Attribute -O--CK 100 100 000 - 0
173 Unknown_Attribute PO--CK 001 001 001 NOW 0
174 Unknown_Attribute -O--CK 100 100 000 - 40
175 Program_Fail_Count_Chip PO--CK 100 100 010 - 326802473589
180 Unused_Rsvd_Blk_Cnt_Tot PO-RCK 130 130 039 - 4294967295
184 End-to-End_Error PO--CK 100 100 000 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
188 Command_Timeout -O--CK 100 100 000 - 25
190 Airflow_Temperature_Cel -O---K 075 070 000 - 25 (Min/Max 14/31)
194 Temperature_Celsius -O---K 100 100 000 - 25
195 Hardware_ECC_Recovered -O-RC- 100 100 000 - 9011196
196 Reallocated_Event_Count PO--CK 099 099 010 - 4
197 Current_Pending_Sector -O--C- 100 100 000 - 0
198 Offline_Uncorrectable ----C- 100 100 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
226 Unknown_SSD_Attribute -O--CK 100 100 000 - 0
227 Unknown_SSD_Attribute -O--CK 100 100 000 - 40
228 Power-off_Retract_Count -O--CK 100 100 000 - 5874
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 8 Comprehensive SMART error log
0x03 GPL,SL R/O 20 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 2 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 SATA NCQ Queued Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xb0 GPL,SL VS 1 Device vendor specific log
0xb1 GPL,SL VS 33 Device vendor specific log
0xb6 GPL,SL VS 127 Device vendor specific log
0xd0 GPL,SL VS 1 Device vendor specific log
0xd1 GPL VS 13056 Device vendor specific log
0xdf GPL VS 1152 Device vendor specific log
0xdf SL VS 128 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (20 sectors)
Device Error Count: 1
CR = Command Register
FEATR = Features Register
COUNT = Count (was: Sector Count) Register
LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8
LH = LBA High (was: Cylinder High) Register ] LBA
LM = LBA Mid (was: Cylinder Low) Register ] Register
LL = LBA Low (was: Sector Number) Register ]
DV = Device (was: Device/Head) Register
DC = Device Control Register
ER = Error register
ST = Status register
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 [0] occurred at disk power-on lifetime: 13029 hours (542 days + 21
hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
00 -- 51 03 f8 00 17 d4 00 ae 18 40 00 Error: at LBA = 0x17d400ae18 =
102341062168
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
61 00 00 03 f8 00 17 d4 00 ae 18 40 00 5d+02:37:46.718 WRITE FPDMA QUEUED
61 00 00 02 68 00 18 4d 00 1c 98 40 00 5d+02:37:46.718 WRITE FPDMA QUEUED
61 00 00 03 f0 00 18 c0 00 d6 10 40 00 5d+02:37:46.714 WRITE FPDMA QUEUED
61 00 00 03 38 00 0a b8 00 f9 d8 40 00 5d+02:37:46.713 WRITE FPDMA QUEUED
61 00 00 00 48 00 0c f0 00 99 10 40 00 5d+02:37:46.710 WRITE FPDMA QUEUED
SMART Extended Self-test Log Version: 1 (2 sectors)
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Short offline Completed: unknown failure 00% 13415 0
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
SCT Support Level: 0
Device State: Active (0)
Current Temperature: 25 Celsius
Power Cycle Min/Max Temperature: 14/31 Celsius
Lifetime Min/Max Temperature: 14/32 Celsius
Under/Over Temperature Limit Count: 0/0
Vendor specific:
00 00 5f 00 00 00 00 00 00 00 00 00 00 00 00 00
00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00
Write SCT Data Table failed: SMART WRITE LOG SECTOR may cause problems, try
with -T permissive to force
Read SCT Temperature History failed
Write SCT (Get) Error Recovery Control Command failed: ATA return descriptor
not supported by controller firmware
SCT (Get) Error Recovery Control command failed
Device Statistics (GP Log 0x04)
Page Offset Size Value Description
1 ===== = = == General Statistics (rev 2) ==
1 0x008 4 42 Lifetime Power-On Resets
1 0x018 6 980854711975 Logical Sectors Written
1 0x020 6 87303310 Number of Write Commands
1 0x028 6 3754714435148 Logical Sectors Read
1 0x030 6 60173330 Number of Read Commands
4 ===== = = == General Errors Statistics (rev 1) ==
4 0x008 4 0 Number of Reported Uncorrectable Errors
4 0x010 4 0 Resets Between Cmd Acceptance and Completion
5 ===== = = == Temperature Statistics (rev 1) ==
5 0x008 1 25 Current Temperature
5 0x010 1 21 Average Short Term Temperature
5 0x018 1 25 Average Long Term Temperature
5 0x020 1 31 Highest Temperature
5 0x028 1 16 Lowest Temperature
5 0x030 1 27 Highest Average Short Term Temperature
5 0x038 1 17 Lowest Average Short Term Temperature
5 0x040 1 25 Highest Average Long Term Temperature
5 0x048 1 20 Lowest Average Long Term Temperature
5 0x050 4 0 Time in Over-Temperature
5 0x058 1 55 Specified Maximum Operating Temperature
5 0x060 4 0 Time in Under-Temperature
5 0x068 1 0 Specified Minimum Operating Temperature
6 ===== = = == Transport Statistics (rev 1) ==
6 0x008 4 582 Number of Hardware Resets
6 0x010 4 182 Number of ASR Events
6 0x018 4 0 Number of Interface CRC Errors
7 ===== = = == Solid State Device Statistics (rev 1) ==
7 0x008 1 255 Percentage Used Endurance Indicator
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x0003 4 0 R_ERR response for device-to-host data FIS
0x0004 4 0 R_ERR response for host-to-device data FIS
0x0006 4 0 R_ERR response for device-to-host non-data FIS
0x000a 4 16 Device-to-host register FISes sent due to a COMRESET
0x000b 4 0 CRC errors within host-to-device FIS
0x000d 4 0 Non-CRC errors within host-to-device FIS
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