Dr Bruce Griffiths wrote: > The attached table of logic gate propagation delay jitter should prove > somewhat challenging to verify with a time interval counter or similar > device. > In fact devising any method of verifying these figures will be somewhat > problematic. > However it could be done using by looking at the change in the output > noise of a high resolution pipeline ADC when such a gate is switched > into the sampling clock path. > Does anyone have any other practical method of measuring such small jitter?
Depending on how much the environment affects the jitter, you could chain a bunch of them together and analyze the resulting distribution. You'd only see the tails of the distribution when the sum of the jitter exceeded your measurement threshold, but if you were willing to make some indepdence and gaussian assumptions, the analysis should be possible. (The sum of two gaussians has variance equal to the sum of the variance of the input gaussians, assuming the variables are independent. The thing I'd worry about is that the jitter you end up measuring is more affected by the environment - temp, EMI, etc. You could correct for that by then measuring the variance of 2x as many chained elements; if the variance was >2x, you'd know you have correlation.) But really, I'd wager there are some very nice, known statistical techniques for doing this. I'm just making something up that seems rational. -Dave _______________________________________________ time-nuts mailing list time-nuts@febo.com https://www.febo.com/cgi-bin/mailman/listinfo/time-nuts