Hello Simon,
On 04/09/2015 03:47 AM, Simon Glass wrote:
On 8 April 2015 at 11:06, Przemyslaw Marczak <p.marc...@samsung.com> wrote:
This commit introduces simple tests for functions:
- uclass_find_first_device()
- uclass_find_next_device()
- uclass_first_device()
- uclass_next_device()
Tests added by this commit:
- Test: dm_test_uclass_devices_find:
* call uclass_find_first_device(), then check if: (dev != NULL), (ret == 0)
* for the rest devices, call uclass_find_next_device() and do the same check
- Test: dm_test_uclass_devices_get:
* call uclass_first_device(), then check if:
-- (dev != NULL), (ret == 0), device_active()
* for the rest devices, call uclass_next_device() and do the same check
Signed-off-by: Przemyslaw Marczak <p.marc...@samsung.com>
Cc: Simon Glass <s...@chromium.org>
Changes V3:
- new commit
---
test/dm/core.c | 34 +++++++++++++++++++++++++++++++++-
1 file changed, 33 insertions(+), 1 deletion(-)
Acked-by: Simon Glass <s...@chromium.org>
See below.
diff --git a/test/dm/core.c b/test/dm/core.c
index 009ad36..3a8dd1d 100644
--- a/test/dm/core.c
+++ b/test/dm/core.c
@@ -656,9 +656,41 @@ static int dm_test_uclass_before_ready(struct
dm_test_state *dms)
return 0;
}
-
DM_TEST(dm_test_uclass_before_ready, 0);
+static int dm_test_uclass_devices_find(struct dm_test_state *dms)
+{
+ struct udevice *dev;
+ int ret;
+
+ for (ret = uclass_find_first_device(UCLASS_TEST, &dev);
+ dev;
+ ret = uclass_find_next_device(&dev)) {
+ ut_assert(!ret);
+ ut_assert(dev);
ut_assert(!device_active(dev));
If you like I can add that when I apply.
I don't think it's a good idea. Those calls above, don't probe the
device, but also don't guarantee that, the returned device was not
probed, before the call.
+ }
+
+ return 0;
+}
+DM_TEST(dm_test_uclass_devices_find, DM_TESTF_SCAN_PDATA);
+
+static int dm_test_uclass_devices_get(struct dm_test_state *dms)
+{
+ struct udevice *dev;
+ int ret;
+
+ for (ret = uclass_first_device(UCLASS_TEST, &dev);
+ dev;
+ ret = uclass_next_device(&dev)) {
+ ut_assert(!ret);
+ ut_assert(dev);
+ ut_assert(device_active(dev));
+ }
+
+ return 0;
+}
+DM_TEST(dm_test_uclass_devices_get, DM_TESTF_SCAN_PDATA);
+
static int dm_test_device_get_uclass_id(struct dm_test_state *dms)
{
struct udevice *dev;
--
1.9.1
Regards,
Simon
Best regards,
--
Przemyslaw Marczak
Samsung R&D Institute Poland
Samsung Electronics
p.marc...@samsung.com
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