Add sample dm reset test for reset_get_by_index and
reset_get_by_index_nodev functionality code.
Cc: Stephen Warren <swar...@nvidia.com>
Cc: Simon Glass <s...@chromium.org>
Signed-off-by: Jagan Teki <ja...@amarulasolutions.com>
---
test/dm/reset.c | 22 ++++++++++++++++++++++
1 file changed, 22 insertions(+)
diff --git a/test/dm/reset.c b/test/dm/reset.c
index c02866a2f0..47198e90ce 100644
--- a/test/dm/reset.c
+++ b/test/dm/reset.c
@@ -5,6 +5,7 @@
#include <common.h>
#include <dm.h>
+#include <reset.h>
#include <dm/test.h>
#include <asm/reset.h>
#include <test/ut.h>
@@ -15,6 +16,27 @@
/* This is the other reset phandle specifier handled by bulk */
#define OTHER_RESET_ID 2
+/* Base test of the reset uclass */
+static int dm_test_reset_base(struct unit_test_state *uts)
+{
+ struct udevice *dev;
+ struct reset_ctl reset_method1;
+ struct reset_ctl reset_method2;
+
+ /* Get the device using the reset device */
+ ut_assertok(uclass_get_device_by_name(UCLASS_MISC, "reset-ctl-test",
+ &dev));
+
+ /* Get the same reset port in 2 different ways and compare */
+ ut_assertok(reset_get_by_index(dev, 1, &reset_method1));
+ ut_assertok(reset_get_by_index_nodev(dev_ofnode(dev), 1,
&reset_method2));
+ ut_asserteq(reset_method1.id, reset_method2.id);
+
+ return 0;
+}
+
+DM_TEST(dm_test_reset_base, DM_TESTF_SCAN_FDT);
+
static int dm_test_reset(struct unit_test_state *uts)
{
struct udevice *dev_reset;
--
2.18.0.321.gffc6fa0e3
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