[PATCH v2 19/45] test: Drop the UT_TESTF_LIVE_OR_FLAT flag

[Simon Glass]

This was a workaround for a rare situation. Now that it will be more
common and we have a proper fix, drop the flag. We can run both types of
tests in the same sandbox executable, even if the flat device tree is
modified.

Signed-off-by: Simon Glass <s...@chromium.org>
---

(no changes since v1)

 include/test/test.h |  2 --
 test/dm/ofnode.c    | 16 +++-------------
 2 files changed, 3 insertions(+), 15 deletions(-)

diff --git a/include/test/test.h b/include/test/test.h
index cd201fb8d55..c028bbb8c89 100644
--- a/include/test/test.h
+++ b/include/test/test.h
@@ -52,8 +52,6 @@ enum {
        UT_TESTF_CONSOLE_REC    = BIT(5),       /* needs console recording */
        /* do extra driver model init and uninit */
        UT_TESTF_DM             = BIT(6),
-       /* live or flat device tree, but not both in the same executable */
-       UT_TESTF_LIVE_OR_FLAT   = BIT(7),
 };
 
 /**
diff --git a/test/dm/ofnode.c b/test/dm/ofnode.c
index 0f65ff939fb..a421392a976 100644
--- a/test/dm/ofnode.c
+++ b/test/dm/ofnode.c
@@ -546,10 +546,6 @@ static int dm_test_ofnode_livetree_writing(struct 
unit_test_state *uts)
        struct udevice *dev;
        ofnode node;
 
-       /* temporarily disable this test due to a failure fixed later */
-       if (!of_live_active())
-               return 0;
-
        /* Test enabling devices */
        node = ofnode_path("/usb@2");
 
@@ -588,7 +584,7 @@ static int dm_test_ofnode_livetree_writing(struct 
unit_test_state *uts)
        return 0;
 }
 DM_TEST(dm_test_ofnode_livetree_writing,
-       UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT | UT_TESTF_LIVE_OR_FLAT);
+       UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
 
 static int dm_test_ofnode_u32(struct unit_test_state *uts)
 {
@@ -603,18 +599,13 @@ static int dm_test_ofnode_u32(struct unit_test_state *uts)
 
        return 0;
 }
-DM_TEST(dm_test_ofnode_u32,
-       UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT | UT_TESTF_LIVE_OR_FLAT);
+DM_TEST(dm_test_ofnode_u32, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
 
 static int dm_test_ofnode_add_subnode(struct unit_test_state *uts)
 {
        ofnode node, check, subnode;
        char buf[128];
 
-       /* temporarily disable this test due to a failure fixed later */
-       if (!of_live_active())
-               return 0;
-
        node = ofnode_path("/lcd");
        ut_assert(ofnode_valid(node));
        ut_assertok(ofnode_add_subnode(node, "edmund", &subnode));
@@ -677,5 +668,4 @@ static int dm_test_ofnode_add_subnode(struct 
unit_test_state *uts)
 
        return 0;
 }
-DM_TEST(dm_test_ofnode_add_subnode,
-       UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT | UT_TESTF_LIVE_OR_FLAT);
+DM_TEST(dm_test_ofnode_add_subnode, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
-- 
2.37.2.789.g6183377224-goog