Hi Emanuele, On Thu, Nov 6, 2025 at 7:22 AM Emanuele Ghidoli <[email protected]> wrote:
> Hi Fabio, Ye, > > At Toradex we have been struggling since quite some time (back to 2018) with Does this problem only affect early i.MX6ULL silicon samples? > the temperature readings and the thermal shutdown behavior on i.MX6ULL. The > issue we observed is that the thermal shutdown seems to trigger too early. > > I have investigated the history around this topic and verified some internal > notes in our bug tracker. With this revert applied, and on the devices we have > (all trimmed with value 0), the reported temperature increases by about 10 °C > compared to before the revert. The absolute accuracy of the readout is > questionable: for example, on a device kept at around 20 °C, the temperature > readout was ~19 °C before the revert, and ~31 °C after the revert. > > Consider that for devices with fuse value of 6, there is a -10 degrees offset > after this revert (so, the other way around). > > I understand that for Sven this revert improves stability during large XZ > decompression in userspace for few devices, but for us it means that the > thermal shutdown happens roughly 10 °C earlier, which is a serious issue in > our case. > > I would kindly ask NXP to double-check how these devices were trimmed. My gut > feeling is that there might be an inconsistency, either the trimming scheme is > not backward-compatible (e.g. old and new devices behave differently, and the > code should cope, I don't know how, with this), or this patch must be reverted > (because introduces a regression). Peng/Ye Li, How does NXP suggest we handle this? Were the early i.MX6ULL parts incorrectly fused? Can the fuse be read and dynamically adjusted? Please advise, thanks.
