Add sections dedicated to explaining how BIST and inline ECC can be enabled via the config fragments.
Signed-off-by: Neha Malcom Francis <[email protected]> --- New patch since v1 doc/board/ti/k3.rst | 55 +++++++++++++++++++++++++++++++++++++++++++++ 1 file changed, 55 insertions(+) diff --git a/doc/board/ti/k3.rst b/doc/board/ti/k3.rst index ed04a57c167..4dae5b4733d 100644 --- a/doc/board/ti/k3.rst +++ b/doc/board/ti/k3.rst @@ -678,6 +678,61 @@ filesystem and then imported fatload mmc ${mmcdev} ${loadaddr} ${bootenvfile} env import -t ${loadaddr} ${filesize} +Built-in Self-Test (BIST) +-------------------------- + +Built-in Self-test (BIST) is a feature that allows self testing of the memory +areas and logic circuitry in an Integrated Circuit (IC) without any external +test equipment. In an embedded system, these tests are typically used during +boot time or shutdown of the system to check the health of an SoC. PBIST is used +to test the memory regions in the SoC and provides detection for permanent +faults. The primary use case for PBIST is when it is invoked at start-up +providing valuable information on any stuck-at bits in the memory. LBIST is used +to test the logic circuitry in an SoC associated with the CPU cores. There are +multiple LBIST instances in the SoC, and each has a different processor core +associated with it. There are LBIST tests that can be software-initiated. + +Current implementation triggers the BIST tests on the MAIN_R5_2_x cores and is +supported only on J784S4-EVM. + +LBIST/PBIST checks of the WKUP_DMSC0 and MCU_R5FSS0 cores and memories are run +in the WKUP/MCU domain; this check is part of HW POST. HW POST runs in hardware, +before the ROM code starts and can be selected by MCU_BOOTMODE[09:08] pins. + +Enable BIST in (:ref:`A72 SPL build <k3_rst_include_start_build_steps_uboot>`) +by including its config fragment. + +.. prompt:: bash $ + + make $UBOOT_CFG_CORTEXA k3_bist.config + +K3 DDR Subsystem (DDRSS) with Inline ECC +---------------------------------------- + +For SDRAM data integrity, the DDRSS bridge supports inline ECC on the data +written to or read from the SDRAM. ECC is stored together with the data so that +a dedicated SDRAM device for ECC is not required. The 8-bit single error +correction double error detection (SECDED) ECC data is calculated over 64-bit +data quanta. For every 256-byte data block 32 bytes of ECC is stored inline. +Thus, 1/9th of the total SDRAM space is used for ECC storage and the remaining +8/9th of the SDRAM data space are seen as consecutive byte addresses. Even if +there are non-ECC protected regions the previously described 1/9th-8/9th rule +still applies and consecutive byte addresses are seen from system point of view. +J784S4 supports up to 3 ECC protected non-overlapping memory ranges. The current +U-Boot release supports a single region covering the entire SDRAM space. + +ECC is calculated for all accesses that are within the address ranges protected +by it. 1-bit error is correctable by ECC, but multi-bit and multiple 1-bit +errors are not correctable and will be treated as an uncorrectable error. Any +uncorrectable error will cause a bus abort. + +Enable inline ECC in (:ref:`R5 SPL build <k3_rst_include_start_build_steps_spl_r5>`) +by including its config fragment: + +.. prompt:: bash $ + + make $UBOOT_CFG_CORTEXR k3_inline_ecc.config + .. _k3_rst_refer_openocd: Common Debugging environment - OpenOCD -- 2.34.1
