smartctl version 5.37 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG HD252KJ
Serial Number: S0NJJDPP900694
Firmware Version: CM100-11
User Capacity: 250,059,350,016 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: Not recognized. Minor revision code: 0x52
Local Time is: Sat Mar 15 00:49:22 2008 CET
==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for
details.
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (4461) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off
support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 76) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED
WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always
- 0
3 Spin_Up_Time 0x0007 100 100 015 Pre-fail Always
- 5440
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always
- 396
5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always
- 0
7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail Always
- 0
8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail Offline
- 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always
- 1754
10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail Always
- 0
11 Calibration_Retry_Count 0x0012 253 253 000 Old_age Always
- 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always
- 207
13 Read_Soft_Error_Rate 0x000e 100 100 000 Old_age Always
- 332734940
187 Unknown_Attribute 0x0032 253 253 000 Old_age Always
- 0
188 Unknown_Attribute 0x0032 100 100 000 Old_age Always
- 7
190 Temperature_Celsius 0x0022 059 057 000 Old_age Always
- 41
194 Temperature_Celsius 0x0022 115 109 000 Old_age Always
- 41
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always
- 332734940
196 Reallocated_Event_Count 0x0032 253 253 000 Old_age Always
- 0
197 Current_Pending_Sector 0x0012 253 253 000 Old_age Always
- 0
198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline
- 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always
- 324
200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age Always
- 0
201 Soft_Read_Error_Rate 0x000a 100 100 000 Old_age Always
- 0
202 TA_Increase_Count 0x0032 253 253 000 Old_age Always
- 0
SMART Error Log Version: 1
ATA Error Count: 63 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 63 occurred at disk power-on lifetime: 1751 hours (72 days + 23 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 80 8f f0 13 e1 Error: ICRC, ABRT at LBA = 0x0113f08f = 18083983
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ca 00 80 8f f0 13 e1 00 01:10:01.250 WRITE DMA
ca 00 c8 b7 ef 13 e1 00 01:10:01.250 WRITE DMA
ec 00 00 00 00 00 a0 00 01:10:01.250 IDENTIFY DEVICE
ef 03 42 00 00 00 a0 00 01:10:01.250 SET FEATURES [Set transfer mode]
ec 00 00 00 00 00 a0 00 01:10:01.250 IDENTIFY DEVICE
Error 62 occurred at disk power-on lifetime: 1751 hours (72 days + 23 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 c8 b7 ef 13 e1 Error: ICRC, ABRT at LBA = 0x0113efb7 = 18083767
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ca 00 c8 b7 ef 13 e1 00 01:10:01.063 WRITE DMA
ca 00 48 67 ef 13 e1 00 01:10:01.063 WRITE DMA
ca 00 08 37 ef 13 e1 00 01:10:01.063 WRITE DMA
ca 00 08 27 ef 13 e1 00 01:10:01.063 WRITE DMA
ca 00 58 c7 ee 13 e1 00 01:10:01.063 WRITE DMA
Error 61 occurred at disk power-on lifetime: 1751 hours (72 days + 23 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 b0 cf e2 13 e1 Error: ICRC, ABRT at LBA = 0x0113e2cf = 18080463
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ca 00 b0 cf e2 13 e1 00 01:09:14.375 WRITE DMA
ca 00 40 87 e2 13 e1 00 01:09:14.375 WRITE DMA
ca 00 50 2f e2 13 e1 00 01:09:14.375 WRITE DMA
ca 00 f8 2f e1 13 e1 00 01:09:14.375 WRITE DMA
ca 00 20 07 e1 13 e1 00 01:09:14.375 WRITE DMA
Error 60 occurred at disk power-on lifetime: 1751 hours (72 days + 23 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 d0 2f e0 13 e1 Error: ICRC, ABRT at LBA = 0x0113e02f = 18079791
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ca 00 d0 2f e0 13 e1 00 01:09:14.188 WRITE DMA
ec 00 00 00 00 00 a0 00 01:09:14.188 IDENTIFY DEVICE
ef 03 42 00 00 00 a0 00 01:09:14.188 SET FEATURES [Set transfer mode]
ec 00 00 00 00 00 a0 00 01:09:14.125 IDENTIFY DEVICE
00 00 01 01 00 00 a0 00 01:09:14.063 NOP [Abort queued commands]
Error 59 occurred at disk power-on lifetime: 1751 hours (72 days + 23 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 d0 2f e0 13 e1 Error: ICRC, ABRT at LBA = 0x0113e02f = 18079791
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ca 00 d0 2f e0 13 e1 00 01:09:13.938 WRITE DMA
ca 00 08 07 e0 13 e1 00 01:09:13.938 WRITE DMA
ec 00 00 00 00 00 a0 00 01:09:13.938 IDENTIFY DEVICE
ef 03 42 00 00 00 a0 00 01:09:13.938 SET FEATURES [Set transfer mode]
ec 00 00 00 00 00 a0 00 01:09:13.938 IDENTIFY DEVICE
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Extended offline Completed without error 00% 1753 -
SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1
SMART Selective self-test log data structure revision number 0
Warning: ATA Specification requires selective self-test log data structure
revision number = 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
--
EXT3-fs error corruption
https://bugs.launchpad.net/bugs/200747
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