W dniu 23.09.2020 o 10:46, David Hunt pisze: > Hi Lukasz, > > > On 23/9/2020 2:47 AM, Lukasz Wojciechowski wrote: >> During review and verification of the patch created by Sarosh Arif: >> "test_distributor: prevent memory leakages from the pool" I found out >> that running distributor unit tests multiple times in a row causes >> fails. >> So I investigated all the issues I found. >> >> There are few synchronization issues that might cause deadlocks >> or corrupted data. They are fixed with this set of patches for both >> tests >> and librte_distributor library. >> >> --- >> v2: >> * assign NULL to freed mbufs in distributor test >> * fix handshake check on legacy single distributor >> rte_distributor_return_pkt_single() >> * add patch 7 passing NULL to legacy API calls if no bufs are returned >> * add patch 8 fixing API documentation >> >> > > Please include any Acked-by or Tested-by tags from previous versions. I added them in v3. I'm very sorry for not including them in v2. > > Rgds, > Dave. > Best regards
Lukasz > > > -- Lukasz Wojciechowski Principal Software Engineer Samsung R&D Institute Poland Samsung Electronics Office +48 22 377 88 25 l.wojciec...@partner.samsung.com
