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https://issues.apache.org/jira/browse/MRUNIT-138?page=com.atlassian.jira.plugin.system.issuetabpanels:comment-tabpanel&focusedCommentId=13432154#comment-13432154
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Bertrand Dechoux commented on MRUNIT-138:
-----------------------------------------
In that case, the backward compatibility is not a big issue. If a test fail, it
means it was badly written ie there was a withInput which was written but had
no consequence. That's quite scary actually.
As for the advantage : the user does not have to instantiate any list or pairs.
I find it more readable to way.
I knew about this 'missing feature' but didn't think about reporting it. I
would be favourable to a fix (because for me it is more like bug).
> Multiple calls to withInput should be supported
> -----------------------------------------------
>
> Key: MRUNIT-138
> URL: https://issues.apache.org/jira/browse/MRUNIT-138
> Project: MRUnit
> Issue Type: Improvement
> Affects Versions: 1.0.0
> Reporter: Dave Beech
>
> As multiple key/val pairs are now supported for tests following MRUNIT-64, it
> feels to me that I should be able to call withInput multiple times in
> sequence in the same way I would usually call withOutput. This doesn't work
> because of the way the deprecation of the old code has been handled.
> Here's a unit test I think should pass:
> (from TestMapDriver - mapper is IdentityMapper)
> @Test
> public void testMultipleWithInput() throws IOException {
> driver.withInput(new Text("foo"), new Text("bar"))
> .withInput(new Text("bar"), new Text("baz"))
> .withOutput(new Text("foo"), new Text("bar"))
> .withOutput(new Text("bar"), new Text("baz"))
> .runTest(false);
> }
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