Brian,

It is puzzling why the CSDS Proposal for 6.5.2.4 would reference the Voltage 
Test (Hipot). I wonder if this was in error.

In UL61010-1 3rd Ed. annex F "Routine Tests", F.3.1, I believe this is 
referring to the HiPot test that you would perform on 100% of your production. 
It states, "The test voltage may be a.c. or d.c. or impulse voltage withstand 
test ......." . So for the HiPot test we are most familiar with it already says 
you can use ac or dc.

In most other sections of the standard where it refers to using the hipot 
voltage test to check the conformity of insulation, creepage, or clearances, if 
generally states something like,

"Conformity is checked by inspection, and by the a.c. test of 6.8.3.1 with a 
duration of at least 1 min, or for MAINS CIRCUITS stressed only by d.c., the 1 
min d.c. test of 6.8.3.2, using the applicable voltage from Table 5."

So in this case it states to use the AC Hipot test, "OR or for MAINS CIRCUITS 
stressed only by d.c., the 1 min d.c. test of 6.8.3.2".

What does "stressed only by d.c." mean?  How are Mains Circuits stressed by 
d.c.?

Do you think the CSDS Proposal has something to do with this wording? Does this 
make it sound like we can only use the AC hipot test?

Thanks to all.
The Other Brian


-----Original Message-----
From: Brian Oconnell [mailto:oconne...@tamuracorp.com]
Sent: Monday, June 23, 2014 8:31 PM
To: EMC-PSTC@LISTSERV.IEEE.ORG
Subject: [PSES] UL61010-1 CSDS Proposal for 6.5.2.4

This is excerpted from the latest UL61010-1 CSDS Proposal for 6.5.2.4 Impedance 
of PROTECTIVE BONDING of plug-connected equipment:

"It was proposed that all hi-pot tests should be permitted to be performed with 
either ac or dc, particularly because OEM power supplies often fail when tested 
with ac, but pass when tested with dc.
This seems to be because IEC 60601-1 3rd edition, IEC 60950, and IEC 62368-1, 
to which most of these power supplies are tested, permit either ac or dc 
testing. The consensus of ISA 82 is that this change is appropriate. It is also 
recommended that this change be reflected in the US comments on Part 1 by the 
USTAG."

Ok, why are component power supplies failing AC, but passing the equivalent DC 
withstand test levels? If from reactance, just control dv/dt (many standards 
provide a min rate). And what does the protective bond test have to do with the 
test conditions for di-electric withstand? Or am I missing something obvious?

Brian

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