https://gcc.gnu.org/bugzilla/show_bug.cgi?id=80759
--- Comment #17 from Daniel Santos <daniel.santos at pobox dot com> --- (In reply to Rainer Orth from comment #15) > Created attachment 41404 [details] > Switch ms-sysv to more regular dg functions You may be surprised to learn how many faulty assumptions you may have about how the gcc test harness works and manages parallelization. I did try your patch and it didn't work. I didn't go too deeply into trying to analyze the failures, but if you call dg-runtest, you are using gcc's hack-daptation of parallelization. However, your patch doesn't remove *my* hack-daptation of parallelization, so we end up with two different parallelization schemes that step on each other's toes. Another problem with the already present parallelization is that it bunches tests into groups of 10 per job which will perform very poorly for these tests. (https://github.com/gcc-mirror/gcc/blob/master/gcc/testsuite/lib/gcc-defs.exp#L170). I presume this is to reduce disk I/O and it makes sense from that standpoint (I don't want to know what it would take to get a ramdisk/tmpfs in a platform-neutral fashion.) However, I'm learning a little more about how the test harness works, and it MAY be possible to call gcc_parallel_test_enable 0 at the start of ms-sysv.exp and be able to use all of the built-in dg-runtest, et. al. functions! If I can get this to work (and not break something else in the process), then we may be on to a pathway to clean up ms-sysv.exp a little bit -- that is except for a few outstanding (possibly surmountable) issues: 1.) Can the default time-out of 5 minutes be changed? I need 20 minutes for the slowest processors and a whole HOUR when full tests are enabled. 2.) The test description should include the generator flags and not just the CFLAGS. Is that possible from dg-runtest, et. al.? I suppose it's always possible to add them to CFLAGS with -DGEN_FLAGS="-p0-12" as a hack. I guess you can see why I said that I was "semi-content" to leave it like it is. :) But I'm also glad to better understand how the test harness parallelization works. Maybe it's possible to make a small modification to dg-defs.exp to get it to divvy out a single test per job instead of 10.
