On Sat, 11 Jul 2026, Jeffrey Law wrote:
> > +/* { dg-final { scan-assembler "slli\ta0,a0,48" } } */
> > +/* { dg-final { scan-assembler "srai\ta0,a0,53" } } */
> > +/* { dg-final { scan-assembler "slli\ta0,a0,40" } } */
> > +/* { dg-final { scan-assembler "srai\ta0,a0,48" } } */
> > +/* { dg-final { scan-assembler "slli\ta0,a0,34" } } */
> > +/* { dg-final { scan-assembler "srai\ta0,a0,54" } } */
> The problem with tests of this style is you're going to be incredibly
> sensitive to register allocation because you're scanning for specific
> registers in the output.
This can be trivially fixed by using backreferences; this is ultimately
TCL after all and you can use all the regexp syntax available. I do
believe I used this feature before in our testsuite (or was it binutils?),
so it wouldn't be exactly new use even if I were the only one.
I can see the submitter has given up too easily and offered a stripped
fix instead that got since committed, but I think the testcase ought to be
retrofitted and I do hope you'll agree given that you claim to be a strong
supporter for test coverage.
Maciej
