Anne & Lynn Wheeler wrote: >(as an aside, after power-on/test sequence ... those circuits get destroyed).
Destroyed after such sequence? I'm having trouble swallowing your statement. ;-D If you, for example, do that in the factory just to test it out before shipping to the customer, it is destroyed? Are you not meaning 'those key get destroyed'? Or do I misunderstand you? Thanks for your post anyway. And thanks to J R and zMan for your reply too about that acronym! Groete / Greetings Elardus Engelbrecht ---------------------------------------------------------------------- For IBM-MAIN subscribe / signoff / archive access instructions, send email to lists...@listserv.ua.edu with the message: INFO IBM-MAIN
