Re: [PATCH 15/18] thermal: exynos: check return values of ->get_trip_[temp,hyst] methods

[Bartlomiej Zolnierkiewicz]

On Tuesday, May 01, 2018 12:43:04 PM Daniel Lezcano wrote:
> On Thu, Apr 26, 2018 at 01:51:30PM +0200, Bartlomiej Zolnierkiewicz wrote:
> > Check return values of ->get_trip_[temp,hyst] methods in
> > exynos_tmu_initialize().
> > 
> > Signed-off-by: Bartlomiej Zolnierkiewicz <b.zolnier...@samsung.com>
> > ---
> >  drivers/thermal/samsung/exynos_tmu.c | 10 +++++++---
> >  1 file changed, 7 insertions(+), 3 deletions(-)
> > 
> > diff --git a/drivers/thermal/samsung/exynos_tmu.c 
> > b/drivers/thermal/samsung/exynos_tmu.c
> > index 244aaf6..abe0737 100644
> > --- a/drivers/thermal/samsung/exynos_tmu.c
> > +++ b/drivers/thermal/samsung/exynos_tmu.c
> > @@ -357,19 +357,23 @@ static int exynos_tmu_initialize(struct 
> > platform_device *pdev)
> >             /* Write temperature code for rising and falling threshold */
> >             for (i = 0; i < ntrips; i++) {
> >                     /* Write temperature code for rising threshold */
> > -                   tzd->ops->get_trip_temp(tzd, i, &temp);
> > +                   ret = tzd->ops->get_trip_temp(tzd, i, &temp);
> > +                   if (ret)
> > +                           goto err;
> >                     temp /= MCELSIUS;
> >                     data->tmu_set_trip_temp(data, i, temp);
> >  
> >                     /* Write temperature code for falling threshold */
> > -                   tzd->ops->get_trip_hyst(tzd, i, &hyst);
> > +                   ret = tzd->ops->get_trip_hyst(tzd, i, &hyst);
> > +                   if (ret)
> > +                           goto err;
> 
> Could this fail for 4210 ?

It can't, please see the method implementation in of-thermal.c:

static int of_thermal_get_trip_hyst(struct thermal_zone_device *tz, int trip,
                                    int *hyst)
{
        struct __thermal_zone *data = tz->devdata;

        if (trip >= data->ntrips || trip < 0)
                return -EDOM;

        *hyst = data->trips[trip].hysteresis;

        return 0;
}

> >                     hyst /= MCELSIUS;
> >                     data->tmu_set_trip_hyst(data, i, temp, hyst);
> >             }
> >  
> >             data->tmu_clear_irqs(data);
> >     }
> > -
> > +err:
> >     clk_disable(data->clk);
> >     mutex_unlock(&data->lock);
> >     if (!IS_ERR(data->clk_sec))

Best regards,
--
Bartlomiej Zolnierkiewicz
Samsung R&D Institute Poland
Samsung Electronics