This is a follow-up patch to the previous one, which fixed a
race-condition during registration of the attribute group.
This fixes the same issue for the binary attributes by adding
them to the properly registered group. As a side effect the
code is further cleaned up.

Signed-off-by: Sebastian Reichel <[email protected]>
---
 drivers/power/supply/ds2781_battery.c | 50 ++++++++++-----------------
 1 file changed, 19 insertions(+), 31 deletions(-)

diff --git a/drivers/power/supply/ds2781_battery.c 
b/drivers/power/supply/ds2781_battery.c
index 5bfd4c77eb89..ea8c66abf602 100644
--- a/drivers/power/supply/ds2781_battery.c
+++ b/drivers/power/supply/ds2781_battery.c
@@ -660,7 +660,7 @@ static ssize_t ds2781_write_param_eeprom_bin(struct file 
*filp,
        return count;
 }
 
-static const struct bin_attribute ds2781_param_eeprom_bin_attr = {
+static struct bin_attribute ds2781_param_eeprom_bin_attr = {
        .attr = {
                .name = "param_eeprom",
                .mode = S_IRUGO | S_IWUSR,
@@ -706,7 +706,7 @@ static ssize_t ds2781_write_user_eeprom_bin(struct file 
*filp,
        return count;
 }
 
-static const struct bin_attribute ds2781_user_eeprom_bin_attr = {
+static struct bin_attribute ds2781_user_eeprom_bin_attr = {
        .attr = {
                .name = "user_eeprom",
                .mode = S_IRUGO | S_IWUSR,
@@ -725,7 +725,6 @@ static DEVICE_ATTR(rsgain_setting, S_IRUGO | S_IWUSR, 
ds2781_get_rsgain_setting,
 static DEVICE_ATTR(pio_pin, S_IRUGO | S_IWUSR, ds2781_get_pio_pin,
        ds2781_set_pio_pin);
 
-
 static struct attribute *ds2781_sysfs_attrs[] = {
        &dev_attr_pmod_enabled.attr,
        &dev_attr_sense_resistor_value.attr,
@@ -734,12 +733,26 @@ static struct attribute *ds2781_sysfs_attrs[] = {
        NULL
 };
 
-ATTRIBUTE_GROUPS(ds2781_sysfs);
+static struct bin_attribute *ds2781_sysfs_bin_attrs[] = {
+       &ds2781_param_eeprom_bin_attr,
+       &ds2781_user_eeprom_bin_attr,
+       NULL,
+};
+
+static const struct attribute_group ds2781_sysfs_group = {
+       .attrs = ds2781_sysfs_attrs,
+       .bin_attrs = ds2781_sysfs_bin_attrs,
+
+};
+
+static const struct attribute_group *ds2781_sysfs_groups[] = {
+       &ds2781_sysfs_group,
+       NULL,
+};
 
 static int ds2781_battery_probe(struct platform_device *pdev)
 {
        struct power_supply_config psy_cfg = {};
-       int ret = 0;
        struct ds2781_device_info *dev_info;
 
        dev_info = devm_kzalloc(&pdev->dev, sizeof(*dev_info), GFP_KERNEL);
@@ -763,35 +776,10 @@ static int ds2781_battery_probe(struct platform_device 
*pdev)
                                                &psy_cfg);
        if (IS_ERR(dev_info->bat)) {
                dev_err(dev_info->dev, "failed to register battery\n");
-               ret = PTR_ERR(dev_info->bat);
-               goto fail;
-       }
-
-       ret = sysfs_create_bin_file(&dev_info->bat->dev.kobj,
-                                       &ds2781_param_eeprom_bin_attr);
-       if (ret) {
-               dev_err(dev_info->dev,
-                               "failed to create param eeprom bin file");
-               goto fail_unregister;
-       }
-
-       ret = sysfs_create_bin_file(&dev_info->bat->dev.kobj,
-                                       &ds2781_user_eeprom_bin_attr);
-       if (ret) {
-               dev_err(dev_info->dev,
-                               "failed to create user eeprom bin file");
-               goto fail_remove_bin_file;
+               return PTR_ERR(dev_info->bat);
        }
 
        return 0;
-
-fail_remove_bin_file:
-       sysfs_remove_bin_file(&dev_info->bat->dev.kobj,
-                               &ds2781_param_eeprom_bin_attr);
-fail_unregister:
-       power_supply_unregister(dev_info->bat);
-fail:
-       return ret;
 }
 
 static int ds2781_battery_remove(struct platform_device *pdev)
-- 
2.19.0

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