This patch modifies temp_crit_show() which is used to create hwmon's sysfs
node to use .get_crit_temp callback function of thermal zone device rather
than .get_trip_temp.
Signed-off-by: Jonghwa Lee <jonghwa3....@samsung.com>
Signed-off-by: MyungJoo Ham <myungjoo....@samsung.com>
---
drivers/thermal/thermal_core.c | 2 +-
1 file changed, 1 insertion(+), 1 deletion(-)
diff --git a/drivers/thermal/thermal_core.c b/drivers/thermal/thermal_core.c
index f753f48..ce4384a 100644
--- a/drivers/thermal/thermal_core.c
+++ b/drivers/thermal/thermal_core.c
@@ -924,7 +924,7 @@ temp_crit_show(struct device *dev, struct device_attribute
*attr,
long temperature;
int ret;
- ret = tz->ops->get_trip_temp(tz, 0, &temperature);
+ ret = tz->ops->get_crit_temp(tz, &temperature);
if (ret)
return ret;
--
1.7.9.5
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