During probe the regulator (if present) was enabled but not disabled in
case of failure. So an unsuccessful probe lead to enabling the
regulator which was actually not needed because the device was not
enabled.
Additionally each deferred probe lead to increase of regulator enable
count so it would not be effectively disabled during removal of the
device.
Signed-off-by: Krzysztof Kozlowski <k.kozlow...@samsung.com>
Fixes: 498d22f616f6 ("thermal: exynos: Support for TMU regulator defined at
device tree")
Cc: <sta...@vger.kernel.org>
---
I am not entirely convinced that this should go to stable. Leaving a
regulator enabled in case of probe failure (no exynos TMU device) or
after deferred probe (regulator won't be disabled during device removal)
is not a critical issue, just leaks power.
---
drivers/thermal/samsung/exynos_tmu.c | 2 ++
1 file changed, 2 insertions(+)
diff --git a/drivers/thermal/samsung/exynos_tmu.c
b/drivers/thermal/samsung/exynos_tmu.c
index 531f4b179871..13c3aceed19d 100644
--- a/drivers/thermal/samsung/exynos_tmu.c
+++ b/drivers/thermal/samsung/exynos_tmu.c
@@ -1392,6 +1392,8 @@ err_clk_sec:
if (!IS_ERR(data->clk_sec))
clk_unprepare(data->clk_sec);
err_sensor:
+ if (!IS_ERR_OR_NULL(data->regulator))
+ regulator_disable(data->regulator);
thermal_zone_of_sensor_unregister(&pdev->dev, data->tzd);
return ret;
--
1.9.1
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