David Brodbeck wrote:
> jan kalcic wrote:
>   
>> In addition, during the wait, the hard disk sounds like it is doing such
>> a big work that it's so busy it can't even move my mouse. Quite strange.
>>
>> Could it even be an hardware (hard disk) problem?
>>   
>>     
>
> That seems very likely.  Often when I have that kind of behavior it's
> because there are bad sectors on the disk and it's having to try
> repeatedly to read data.  You may even see I/O errors in your syslog.
>
> I would run the SMART self-test, if it's supported -- see the 'smartctl'
> manpage for details.  Most likely your disk is dying.
>   
So hardware problem, right? :(

It reports some errors but it seems to be always the same one and I'm
not sure they are what you guess.

smartctl version 5.37 [i686-suse-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Model Family:     Hitachi Travelstar 5K80 family
Device Model:     HTS548060M9AT00
Serial Number:    MRLB55L4HZNEHC
Firmware Version: MGBOA5EA
User Capacity:    60,011,642,880 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   6
ATA Standard is:  ATA/ATAPI-6 T13 1410D revision 3a
Local Time is:    Mon Apr  2 02:30:22 2007 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x85) Offline data collection activity
                                        was aborted by an interrupting
command from host.
                                        Auto Offline Data Collection:
Enabled.
Self-test execution status:      (   0) The previous self-test routine
completed
                                        without error or no self-test
has ever
                                        been run.
Total time to complete Offline
data collection:                 ( 645) seconds.
Offline data collection
capabilities:                    (0x5b) SMART execute Offline immediate.
                                        Auto Offline data collection
on/off support.
                                        Suspend Offline collection upon new
                                        command.
                                        Offline surface scan supported.
                                        Self-test supported.
                                        No Conveyance Self-test supported.
                                        Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                                        General Purpose Logging supported.
Short self-test routine
recommended polling time:        (   2) minutes.
Extended self-test routine
recommended polling time:        (  46) minutes.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE     
UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000b   084   084   062    Pre-fail 
Always       -       2097461
  2 Throughput_Performance  0x0005   100   100   040    Pre-fail 
Offline      -       604
  3 Spin_Up_Time            0x0007   148   148   033    Pre-fail 
Always       -       2
  4 Start_Stop_Count        0x0012   100   100   000    Old_age  
Always       -       808
  5 Reallocated_Sector_Ct   0x0033   095   095   005    Pre-fail 
Always       -       0
  7 Seek_Error_Rate         0x000b   100   100   067    Pre-fail 
Always       -       0
  8 Seek_Time_Performance   0x0005   100   100   040    Pre-fail 
Offline      -       0
  9 Power_On_Hours          0x0012   096   096   000    Old_age  
Always       -       2120
 10 Spin_Retry_Count        0x0013   100   100   060    Pre-fail 
Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age  
Always       -       800
191 G-Sense_Error_Rate      0x000a   098   098   000    Old_age  
Always       -       65540
192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age  
Always       -       63
193 Load_Cycle_Count        0x0012   093   093   000    Old_age  
Always       -       73182
194 Temperature_Celsius     0x0002   141   141   000    Old_age  
Always       -       39 (Lifetime Min/Max 7/52)
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age  
Always       -       376
197 Current_Pending_Sector  0x0022   100   100   000    Old_age  
Always       -       201
198 Offline_Uncorrectable   0x0008   100   100   000    Old_age  
Offline      -       0
199 UDMA_CRC_Error_Count    0x000a   200   200   000    Old_age  
Always       -       0

SMART Error Log Version: 1
ATA Error Count: 21303 (device log contains only the most recent five
errors)
        CR = Command Register [HEX]
        FR = Features Register [HEX]
        SC = Sector Count Register [HEX]
        SN = Sector Number Register [HEX]
        CL = Cylinder Low Register [HEX]
        CH = Cylinder High Register [HEX]
        DH = Device/Head Register [HEX]
        DC = Device Command Register [HEX]
        ER = Error register [HEX]
        ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 21303 occurred at disk power-on lifetime: 2118 hours (88 days + 6
hours)
  When the command that caused the error occurred, the device was active
or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 03 3c 62 65 e2  Error: UNC 3 sectors at LBA = 0x0265623c = 40198716

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 08 37 62 65 e0 00      07:44:17.200  READ DMA EXT
  e7 00 00 00 00 00 a0 00      07:44:11.600  FLUSH CACHE
  e7 00 00 00 00 00 a0 00      07:44:11.600  FLUSH CACHE
  35 00 08 97 0a 4c e0 00      07:44:11.600  WRITE DMA EXT
  e7 00 00 00 00 00 a0 00      07:44:11.600  FLUSH CACHE

Error 21302 occurred at disk power-on lifetime: 2118 hours (88 days + 6
hours)
  When the command that caused the error occurred, the device was active
or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 03 3c 62 65 e2  Error: UNC 3 sectors at LBA = 0x0265623c = 40198716

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 08 37 62 65 e0 00      07:32:18.000  READ DMA EXT
  35 00 10 97 1c 4a e0 00      07:32:18.000  WRITE DMA EXT
  35 00 08 f8 3a d3 e0 00      07:32:18.000  WRITE DMA EXT
  35 00 10 e0 a4 2c e0 00      07:32:18.000  WRITE DMA EXT
  35 00 08 37 1f a2 e0 00      07:32:18.000  WRITE DMA EXT

Error 21301 occurred at disk power-on lifetime: 2118 hours (88 days + 6
hours)
  When the command that caused the error occurred, the device was active
or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 03 3c 62 65 e2  Error: UNC 3 sectors at LBA = 0x0265623c = 40198716

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 08 37 62 65 e0 00      07:32:14.100  READ DMA EXT
  35 00 08 5f b7 a5 e0 00      07:32:12.800  WRITE DMA EXT
  35 00 08 cf b6 a5 e0 00      07:32:12.800  WRITE DMA EXT
  35 00 20 3f 1f a2 e0 00      07:32:12.800  WRITE DMA EXT
  e7 00 00 00 00 00 a0 00      07:32:08.400  FLUSH CACHE

Error 21300 occurred at disk power-on lifetime: 2118 hours (88 days + 6
hours)
  When the command that caused the error occurred, the device was active
or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 03 3c 62 65 e2  Error: UNC 3 sectors at LBA = 0x0265623c = 40198716

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 08 37 62 65 e0 00      07:24:15.800  READ DMA EXT
  25 00 08 37 62 65 e0 00      07:24:11.900  READ DMA EXT
  35 00 08 28 a9 ca e0 00      07:24:11.000  WRITE DMA EXT
  e7 00 00 00 00 00 a0 00      07:24:06.200  FLUSH CACHE
  e7 00 00 00 00 00 a0 00      07:24:06.200  FLUSH CACHE

Error 21299 occurred at disk power-on lifetime: 2118 hours (88 days + 6
hours)
  When the command that caused the error occurred, the device was active
or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 03 3c 62 65 e2  Error: UNC 3 sectors at LBA = 0x0265623c = 40198716

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 08 37 62 65 e0 00      07:24:11.900  READ DMA EXT
  35 00 08 28 a9 ca e0 00      07:24:11.000  WRITE DMA EXT
  e7 00 00 00 00 00 a0 00      07:24:06.200  FLUSH CACHE
  e7 00 00 00 00 00 a0 00      07:24:06.200  FLUSH CACHE
  35 00 08 d7 eb 4b e0 00      07:24:06.200  WRITE DMA EXT

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining 
LifeTime(hours)  LBA_of_first_error
# 1  Short offline       Completed without error       00%        
1         -
# 2  Short offline       Completed without error       00%        
0         -

Warning! SMART Selective Self-Test Log Structure error: invalid SMART
checksum.
SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.




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