At 04:53 PM 11/19/01 -0600, Matt Pobursky wrote: >Actually, the high speed digital testers employed by the memory >manufacturers FULLY test memory modules over their rated speed >and voltage ranges. Usually any problems that occur after the >module leaves the factory are due to handling, installation or >motherboard related issues (timing, voltage, noise, etc.) Memory >chips themselves are 100% parametrically tested after they are >packaged since the manufacturer is in the business of selling >specified, functional chips.
It is practically impossible to *fully* test a large memory chip because there can be data-sensitive errors. I.e., when this cell is 1 and that cell is 0 and this row over here is all 1s, and then one writes such and such to a cell, there is an error. Especially dynamic memory can be vulnerable to this. Last time I remember running memory tests, there were options to test them six ways until Sunday. It was very time-consuming. On the one hand, the computers were slow by today's standards; on the other hand, the memory chips were much smaller (i.e., fewer cells). >At any rate... if anyone is interested in FULLY testing your >system memory, you can get a great FREE memory test program at: > >http://www.teresaudio.com/memtest86/ Thanks for the URL! [EMAIL PROTECTED] Abdulrahman Lomax Easthampton, Massachusetts USA * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * To post a message: mailto:[EMAIL PROTECTED] * * To leave this list visit: * http://www.techservinc.com/protelusers/leave.html * * Contact the list manager: * mailto:[EMAIL PROTECTED] * * Forum Guidelines Rules: * http://www.techservinc.com/protelusers/forumrules.html * * Browse or Search previous postings: * http://www.mail-archive.com/[email protected] * * * * * * * * * * * * * * * * * * * * * * * * * * * * * *
