> > +# @temperature: Device temperature in degrees Celsius. > > +# > > +# @dirty-shutdown-count: Number of time the device has been unable to > > Number of times > > > +# determine whether data loss may have occurred. > > +# > > +# @corrected-volatile-error-count: Total number of correctable errors in > > +# volatile memory. > > +# > > +# @corrected-persistent-error-count: Total number correctable errors in > > +# persistent memory > > Please format like > > # @flags: Event Record Flags. See CXL r3.0 Table 8-42 Common Event > # Record Format, Event Record Flags for subfield definitions. > # > # @type: Device Event Type. See CXL r3.0 Table 8-45 Memory Module > # Event Record for bit definitions for bit definiions. > # > # @health-status: Overall health summary bitmap. See CXL r3.0 Table > # 8-100 Get Health Info Output Payload, Health Status for bit > # definitions. > # > # @media-status: Overall media health summary. See CXL r3.0 Table > # 8-100 Get Health Info Output Payload, Media Status for bit > # definitions. > # > # @additional-status: See CXL r3.0 Table 8-100 Get Health Info Output > # Payload, Additional Status for subfield definitions. > # > # @life-used: Percentage (0-100) of factory expected life span. > # > # @temperature: Device temperature in degrees Celsius. > # > # @dirty-shutdown-count: Number of time the device has been unable to > # determine whether data loss may have occurred.
With "Number of times" this runs to 71 chars. reflowed appropriately for v8 > # > # @corrected-volatile-error-count: Total number of correctable errors > # in volatile memory. > # > # @corrected-persistent-error-count: Total number correctable errors > # in persistent memory > > to blend in with recent commit a937b6aa739 (qapi: Reformat doc comments > to conform to current conventions). > > > > +#
