Hi all,
We have a newly created position for an individual to work with us on
the certification of NIST Standard Reference Materials for powder and
thin film diffraction and reflectometry methods. The desired
background is one with theoretical leanings and competence in
programing and data analysis methods.
Please don't hesitate to contact Don Windover, 301 975 6102, or
myself with any questions.
Regards,
Jim
Official Solicitation:
CERAMICS DIVISION
MATERIALS SCIENCE AND ENGINEERING LABORATORY (MSEL)
NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (NIST)
ANALYST, X-RAY METROLOGY AND REFLECTROMETRY
STRUCTURE DETERMINATION METHODS GROUP
Applications are invited from qualified candidates for a research
position involving analytical methods in X-ray reflectometry and
reflectivity (XRR), high-resolution X-ray diffraction (HRXRD), and
powder diffraction (XRPD) within the Structure Determination Methods
Group, Ceramics Division, at NIST in Gaithersburg, Maryland. The
position is specific to the X-ray Metrology (XRPD and HRXRD) and XRR
projects in the Structure Determination Methods Group, one of four
groups in the Ceramics Division. These projects provide the
measurement science, Standard Reference Materials (SRMs), and
advanced measurement methods needed by U.S. industry to apply XRR,
HRXRD, and XRPD techniques across the entire spectrum of materials
science and engineering. The Ceramics Division has built SI-traceable
X-ray metrology instrumentation featuring advanced X-ray
monochromator optics, optical angle encoders, and autocollimation techniques.
More information about other activities in the Ceramics Division may
be found on our website,
<http://www.ceramics.nist.gov/>http://www.ceramics.nist.gov/.
The research position will involve work with experimental data and
physical and statistical theories of thin film analysis by XRR and
HRXRD, and microstructure (size and strain) analysis by X-ray and
neutron powder diffraction. Use of sophisticated statistical methods
and theory will be required for parameter estimation and model
comparison, e.g., Bayesian and Monte Carlo approaches. Estimating
uncertainties in parameters of physical models (particularly
uncertainties across various models) from measurements pertaining to
SRMs is of paramount interest. The position will require research as
part of a project team and participation in efforts with project,
Group, and Division leadership to define new measurement directions.
Applicants should have experience in implementing data analysis or
physical models in mainstream languages for scientific computing
(e.g., Python, C, Fortran), preferably with code available for
review. It is highly desirable that applicants have a Ph.D. in
applied mathematics, computational physics, scientific computing,
statistics, physics, materials science, or other related disciplines.
Demonstrated completion of projects resulting in publication outputs
is required. Experience with specialized environments for instrument
control or data analysis (especially Labview, but also Mathematica,
Matlab, R) is also valuable. A background in thin films, materials
science, or dynamical diffraction or scattering would also be relevant.
The position is in the Scientific and Engineering Career Path ("ZP")
and is initially a two-year appointment, with potential for a
permanent appointment. The base salary ranges from $70,000 to
$110,000, depending on qualifications and experience. United States
citizenship is required.
Interested applicants should send a curriculum vita and three
references (names and contact information only) via post or e-mail to
Dr. Terrell Vanderah, Acting Leader, Structure Determination Methods
Group, Ceramics Division, NIST, 100 Bureau Drive, Stop 8520,
Gaithersburg, MD 20899, [EMAIL PROTECTED] Applications must
be received by April 15, 2008.
NIST, a bureau of the U.S. Department of Commerce, is an Equal
Opportunity Employer.
James P. Cline
Ceramics Division
National Institute of Standards and Technology
100 Bureau Dr. stop 8520 [ B113 / Bldg 217 ]
Gaithersburg, MD 20899-8523 USA
[EMAIL PROTECTED]
(301) 975 5793
FAX (301) 975 5334
