Effective dates of standards

2005-08-03 Thread emc-p...@ieee.org
Is there a website where I can quickly check the effective implementing or withdrawal dates of standards? Thanks. Regards, Wendy Nya LabOne Singapore Pte Ltd This message is from the IEEE Product Safety Engineering Society

ISO 17025 Section 5.5.10 Intermediate Checks

2005-08-03 Thread emc-p...@ieee.org
Dear All, I am preparing my laboratory for accreditation. Referring to ISO 17025 Section 5.5.10 Intermediate Checks, I am uncertain on the extent of checks required. For example, IEC 61000-4-11 Section 6.1.2 Verification of the characteristics of the voltage dips, short interruptions gener

Needed: Compliance Documentation Clerk Help ASAP, San Jose CA. Area

2005-08-03 Thread emc-p...@ieee.org
Just to clarify, this is a clerical position and does NOT require engineering skills. The ideal person for this contract position would be someone that has written compliance test reports, TCF's, or has complied documentation for country specific homologation projects. Most likely they would have o

Re: Test Issues for ITE Shipped with Data

2005-08-03 Thread emc-pstc@LISTSERV.IEEE.ORG
Sudhakar Wasnik wrote (in ) about 'Test Issues for ITE Shipped with Data', on Wed, 3 Aug 2005: >Any kind except (completely crushed like many pieces) Nothing really to do with exposure to EM fields, then. -- Regards, John Woodgate, OOO - Own Opinions Only. Deadlines are 90% of deadliness. http

RE: Test Issues for ITE Shipped with Data

2005-08-03 Thread emc-p...@ieee.org
Any kind except (completely crushed like many pieces) Sudhakar From: emc-p...@ieee.org [mailto:emc-p...@ieee.org] On Behalf Of John Woodgate Sent: Wednesday, August 03, 2005 11:37 AM To: emc-p...@ieee.org Subject: Re: Test Issues for ITE Shipped with Data Sudhakar Wasnik wrote (in ) about 'Te

Re: Test Issues for ITE Shipped with Data

2005-08-03 Thread emc-p...@ieee.org
Sudhakar Wasnik wrote (in ) about 'Test Issues for ITE Shipped with Data', on Wed, 3 Aug 2005: >The Physical damages to cards are common, But the stored data is never >lost. Companies have recovered the data even from the broken >(physically) cards. What sort of physical damage and is the ca

Wanted: Compliance Admin Help ASAP, San Jose CA. Area

2005-08-03 Thread emc-p...@ieee.org
Group, I immediately need some Admin help with a Compliance & Homologation project. Pays, $25 - $35 per hour depending on experience. Can be full-time or part-time but I prefer full-time for the first couple of weeks. Scope of work is initially 2-4 months but it could go longer. If you are intere

Re: Test Issues for ITE Shipped with Data

2005-08-03 Thread emc-pstc@LISTSERV.IEEE.ORG
Kevin Chu wrote (in ) about 'Test Issues for ITE Shipped with Data', on Wed, 3 Aug 2005: >The USPS Anthrax procedure is known to damage compact-flash cards, >pharmaceuticals, contact lenses, biological samples, and photographic >film. > >http://www.dpreview.com/news/0201/02010803mailcleaningz

RE: Test Issues for ITE Shipped with Data

2005-08-03 Thread emc-pstc@LISTSERV.IEEE.ORG
CF, SD, Micro SD etc Associations comply with the association standards. The Physical damages to cards are common, But the stored data is never lost. Companies have recovered the data even from the broken (physically) cards. Sudhakar From: emc-p...@ieee.org [mailto:emc-p...@ieee.org] On Behalf

RE: Test Issues for ITE Shipped with Data

2005-08-03 Thread emc-p...@ieee.org
The article referenced below indicates that it is the "CompactFlash Association" that has reported the damage. I don't know whether or not the vulnerability is caused by improper manufacturer implementation of the flash. Kevin From: Sudhakar Wasnik [mailto:swas...@sandisk.com] Sent: August 3,

RE: Test Issues for ITE Shipped with Data

2005-08-03 Thread emc-p...@ieee.org
The storage devices like CF, SD, Cruzers etc (Based on the Flash Technology) are evaluated to X ray radiation, Gamma Radiation and Solar Radiation. This technology is proven and it conforms to several JEDEC standards. Sudhakar From: emc-p...@ieee.org [mailto:emc-p...@ieee.org] On Behalf Of Kev

Re: Test Issues for ITE Shipped with Data

2005-08-03 Thread emc-p...@ieee.org
"Monsen, Monrad L" wrote (in ) about 'Test Issues for ITE Shipped with Data', on Wed, 3 Aug 2005: >What are some of the ElectroMagnetic Compatibility (EMC) environments >that a product will experience in shipping either by FEDEX/UPS/USPS or >by air transport? Are there any EMC immunity standa

RE: Test Issues for ITE Shipped with Data

2005-08-03 Thread emc-p...@ieee.org
The USPS Anthrax procedure is known to damage compact-flash cards, pharmaceuticals, contact lenses, biological samples, and photographic film. http://www.dpreview.com/news/0201/02010803mailcleaningzap.asp Kevin From: emc-p...@ieee.org [mailto:emc-p...@ieee.org] On Behalf Of Monsen, Monrad L Sen

Test Issues for ITE Shipped with Data

2005-08-03 Thread emc-p...@ieee.org
What are some of the ElectroMagnetic Compatibility (EMC) environments that a product will experience in shipping either by FEDEX/UPS/USPS or by air transport? Are there any EMC immunity standards suggested for shipping? We all know that all suitcases and carry-on bags are inspected by X-ray mac