Test Issues for ITE Shipped with Data

2005-08-03 Thread emc-p...@ieee.org
What are some of the ElectroMagnetic Compatibility (EMC) environments that a product will experience in shipping either by FEDEX/UPS/USPS or by air transport? Are there any EMC immunity standards suggested for shipping? We all know that all suitcases and carry-on bags are inspected by X-ray mac

Re: Test Issues for ITE Shipped with Data

2005-08-03 Thread emc-pstc@LISTSERV.IEEE.ORG
Sudhakar Wasnik wrote (in ) about 'Test Issues for ITE Shipped with Data', on Wed, 3 Aug 2005: >Any kind except (completely crushed like many pieces) Nothing really to do with exposure to EM fields, then. -- Regards, John Woodgate, OOO - Own Opinions Only. Deadlines are 90%

RE: Test Issues for ITE Shipped with Data

2005-08-03 Thread emc-p...@ieee.org
Any kind except (completely crushed like many pieces) Sudhakar From: emc-p...@ieee.org [mailto:emc-p...@ieee.org] On Behalf Of John Woodgate Sent: Wednesday, August 03, 2005 11:37 AM To: emc-p...@ieee.org Subject: Re: Test Issues for ITE Shipped with Data Sudhakar Wasnik wrote (in ) about

Re: Test Issues for ITE Shipped with Data

2005-08-03 Thread emc-p...@ieee.org
Sudhakar Wasnik wrote (in ) about 'Test Issues for ITE Shipped with Data', on Wed, 3 Aug 2005: >The Physical damages to cards are common, But the stored data is never >lost. Companies have recovered the data even from the broken >(physically) cards. What sort of physica

Re: Test Issues for ITE Shipped with Data

2005-08-03 Thread emc-pstc@LISTSERV.IEEE.ORG
Kevin Chu wrote (in ) about 'Test Issues for ITE Shipped with Data', on Wed, 3 Aug 2005: >The USPS Anthrax procedure is known to damage compact-flash cards, >pharmaceuticals, contact lenses, biological samples, and photographic >film. > >http://w

RE: Test Issues for ITE Shipped with Data

2005-08-03 Thread emc-pstc@LISTSERV.IEEE.ORG
Behalf Of Kevin Chu Sent: Wednesday, August 03, 2005 10:38 AM To: emc-p...@ieee.org Subject: RE: Test Issues for ITE Shipped with Data The article referenced below indicates that it is the "CompactFlash Association" that has reported the damage. I don't know whether or not the vulnerab

RE: Test Issues for ITE Shipped with Data

2005-08-03 Thread emc-p...@ieee.org
Sent: August 3, 2005 10:32 AM To: Kevin Chu; emc-p...@ieee.org Subject: RE: Test Issues for ITE Shipped with Data The storage devices like CF, SD, Cruzers etc (Based on the Flash Technology) are evaluated to X ray radiation, Gamma Radiation and Solar Radiation. This technology is proven and

RE: Test Issues for ITE Shipped with Data

2005-08-03 Thread emc-p...@ieee.org
Kevin Chu Sent: Wednesday, August 03, 2005 10:15 AM To: emc-p...@ieee.org Subject: RE: Test Issues for ITE Shipped with Data The USPS Anthrax procedure is known to damage compact-flash cards, pharmaceuticals, contact lenses, biological samples, and photographic film. http://www.dpreview.com/news

Re: Test Issues for ITE Shipped with Data

2005-08-03 Thread emc-p...@ieee.org
"Monsen, Monrad L" wrote (in ) about 'Test Issues for ITE Shipped with Data', on Wed, 3 Aug 2005: >What are some of the ElectroMagnetic Compatibility (EMC) environments >that a product will experience in shipping either by FEDEX/UPS/USPS or >by air transport

RE: Test Issues for ITE Shipped with Data

2005-08-03 Thread emc-p...@ieee.org
Sent: August 3, 2005 9:11 AM To: emc-p...@ieee.org Subject: Test Issues for ITE Shipped with Data What are some of the ElectroMagnetic Compatibility (EMC) environments that a product will experience in shipping either by FEDEX/UPS/USPS or by air transport? Are there any EMC immunity standards