2005 Siena Crystallographic Computing School - 18th to 23rd August, 2005
Certosa di Pontignano, University of Siena, Tuscany, Italy,
http://www.iucr.org/iucr-top/comm/ccom/siena2005/
Registration information:
http://www.iucr.org/iucr-top/comm/ccom/siena2005/registration.html
I guess, this discussion has already died down but I couldn't find a moment for
reply soon enough:-)
As Prague was already mentioned, let me try to summarize what I think about
this subject and have said there (let's hope I actually remember it:-):
1. A careful line broadening analysis (at this
Hi,
maybe I'm late in the discussion, but what about if we use a Rietveld ( or
whole pattern fitting) refinement in order to extract data for the profile
and use it to make the extraction of size and strain effects?
thanks and greetings
Miguel Hesiquio-Garduño
Profesor Asociado C
Departamento d
> 8. The simple modified TCH model ("triple-Voigt"), used in most major
> Rietveld programs these days, is surprisingly flexible. It works well
> for most of the samples ("super-Lorentzian" is an example when it
> fails, as well as many others, but this is less frequent that
> onewould expect) and
