these data in Origin and will get a chart-graph. But is there any
software that I can use to create a profiles (even with simple Lorentzian)
from these data in order to make the graph looking more close to the real
powder diffraction pattern?
Thanks,
Srebri Petrov
.
If this may help you, I can send to you the these 8 raw-files in x_y format.
At least they can be used as references for identification and
distinguishing of various Al-oxides.
Best regards,
Srebri
/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\
Dr. Srebri Petrov, PXRD Lab
Dept. of Chemistry, University
is (with Fundamental Parameters Approach -
FPA) within the range of 4-6 nm. But, again, such results I still consider
as questionable and so, any other opinions from the list are welcome.
Best,
Srebri
/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\
Dr. Srebri Petrov, PXRD Lab
Dept. of Chemistry, University of Toronto,
Tel
.
Zavalij P.), 2003.
/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\
Dr. Srebri Petrov, PXRD Lab
Dept. of Chemistry, University of Toronto,
Tel/Fax: 416-978-1389
- Original Message -
From: Magnus Helgerud Sørby [EMAIL PROTECTED]
To: rietveld_l@ill.fr
Sent: Thursday, June 22, 2006 5:00 AM
Dear Leonid
Hi
Are you sure that my computer is affected?
I did not have any problems so far reading and sending my e-mails.
However, I couldn't read the attached file as it appears with strange signs
in Notepad.
I am willing to help if I can assist you regarding this matter.
Could you provide more detailed
Hi,
Looking at the attached file, my opinion is that this effect is caused by a
quite large divergent (or both divergent and anti-scattering) slits. It is
not normal to have over 1000 counts at 5 degrees 2-theta. This could be due
either by a portion of incident beam or by a scattering from the
Dear All.
I fully support the nice idea of Helio for establishing a powder diffraction
Database. If we can make it, this will be one of the biggest achievements of
these two groups (Rietveld and SDPD). My personal opinion is that such a
database will provide excellent opportunities for