Hi,
yet another drive with [Subject] message...
Case label:
P/N: MUD10EA/G2 RATED: +5V =~ 0.85A
KCC-REM-SEC-HX-MUD10EA S2 Portable 1TB
# update-smart-drivedb
/var/lib/smartmontools/drivedb/drivedb.h updated from trunk
# smartctl -a /dev/sdc
smartctl 6.4 2014-09-29 r3990 [i686-linux-3.16.0-00046-g68e0854] (local
build)
Copyright (C) 2002-14, Bruce Allen, Christian Franke,
www.smartmontools.org
/dev/sdc: Unknown USB bridge [0x04e8:0x1f0a (0x000)]
Please specify device type with the -d option.
Use smartctl -h to get a usage summary
# smartctl -d usbjmicron -a /dev/sdc
smartctl 6.4 2014-09-29 r3990 [i686-linux-3.16.0-00046-g68e0854] (local build)
Copyright (C) 2002-14, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: SAMSUNG SpinPoint M8U (USB)
Device Model: SAMSUNG HN-M101XBB
Serial Number: C7102Gxxxxxx1R
LU WWN Device Id: 5 0000f0 0axxxxxxx
Firmware Version: 2AR10001
User Capacity: 1.000.204.886.016 bytes [1,00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: 5400 rpm
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 3.0, 3.0 Gb/s (current: 1.5 Gb/s)
Local Time is: Mon Nov 17 22:20:31 2014 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (12840) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off supp
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 214) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED
WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always
- 0
2 Throughput_Performance 0x0026 252 252 000 Old_age Always
- 0
3 Spin_Up_Time 0x0023 085 085 025 Pre-fail Always
- 4616
4 Start_Stop_Count 0x0032 099 099 000 Old_age Always
- 1108
5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always
- 0
7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always
- 0
8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline
- 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always
- 289
10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always
- 0
11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always
- 5
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always
- 516
181 Program_Fail_Cnt_Total 0x0022 100 100 000 Old_age Always
- 5900815
191 G-Sense_Error_Rate 0x0022 100 100 000 Old_age Always
- 181
192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always
- 0
194 Temperature_Celsius 0x0002 064 064 000 Old_age Always
- 24 (Min/Max 1
195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always
- 0
196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always
- 0
197 Current_Pending_Sector 0x0032 252 252 000 Old_age Always
- 0
198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline
- 0
199 UDMA_CRC_Error_Count 0x0036 200 200 000 Old_age Always
- 0
200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always
- 4066
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always
- 5
225 Load_Cycle_Count 0x0032 100 100 000 Old_age Always
- 9923
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been ru
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Completed [00% left] (0-65535)
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
No SMART attributes have any "unknown" description,
so from an implementation POV we seem to be fine here :-)
(I won't comment on certain somewhat more troubling attribute counts though...)
So, for automatic recognition purposes
this device appears to need a "-d usbjmicron" entry
added to the controller database, too.
Note that "-d sat" does work, too,
but I guess that since according to lsusb -v this is a JMicron controller,
"-d usbjmicron" should be preferable (or would there be cases
where operating system environments support "-d sat" only?).
# lsusb
Bus 001 Device 048: ID 04e8:1f0a Samsung Electronics Co., Ltd
I will soon proceed with adding an entry to Wiki Supported_USB-Devices...
Thanks,
Andreas Mohr
--
GNU/Linux. It's not the software that's free, it's you.
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