Hi,
When i executed the TCL: tests on my ARM board (nitrogen 6X) the below tests
are
failing with the message
Expected: [0 ok]
Got: [1 {nfail=1 rc=1 result=disk I/O error}]
sysfault-2.1-vfsfault-transient
memsubsys1.sysfault-2.1-vfsfault-transient
memsubsys2.sysfault-2.1-vfsfault-transient
no_mutex_try.sysfault-2.1-vfsfault-transient
journaltest.sysfault-2.1-vfsfault-transient
inmemory_journal.sysfault-2.1-vfsfault-transient
What could be the reason for these failures? and how can i proceed further
with this ?
Thank You
Brijesh
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