On 03/11/2013 10:52 AM, bkk wrote:
Hi,When i executed the TCL: tests on my ARM board (nitrogen 6X) the below tests are failing with the message Expected: [0 ok] Got: [1 {nfail=1 rc=1 result=disk I/O error}] sysfault-2.1-vfsfault-transient memsubsys1.sysfault-2.1-vfsfault-transient memsubsys2.sysfault-2.1-vfsfault-transient no_mutex_try.sysfault-2.1-vfsfault-transient journaltest.sysfault-2.1-vfsfault-transient inmemory_journal.sysfault-2.1-vfsfault-transient What could be the reason for these failures? and how can i proceed further with this ?
The tests inject errors into various system calls (open, ftruncate, close, read - you can see the list in the test file). The errors are injected such that they set errno to EINTR. In this case SQLite is supposed to retry the system call. But in your case it looks like it is returning an error to the user instead. Are the test case names above truncated? Do you mean that all tests that match the pattern "sysfault-2.1-vfsfault-transient*" etc. failed? Dan. _______________________________________________ sqlite-users mailing list sqlite-users@sqlite.org http://sqlite.org:8080/cgi-bin/mailman/listinfo/sqlite-users
