http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=4030739&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D4030739
<http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=4030739&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D4030739>
is one of the best in that it gives guidance on selecting suitable
test oscillator periods.
It also details how the integral linearity can be derived from the
test.
There are a couple of minor errors in the paper.
Bruce
Thank you for the references, unfortunately I dont
have an account to access to IEEE papers.
P.S. The micro's adc is charachterized
for total unadjusted error of +-2LSB Max
at 25°C, 12bit total.
It's s-h is 8pF with 1kohm in series,
probably I can sync the sampling to
open just before the pulse, and close
after the fact.
What error is that:
As per the datasheet blah blah :) :
"the total unadjusted error (TUE) is defined as the
maximum deviation between the actual and the ideal
transfer curves. It is a parameter that specifies
the total errors that may occur, causing maximum
deviation between the ideal digital output and the
actual digital output. It is the maximum deviation
recorded between the ideal expected value and the
actual value obtained from the ADC for any input voltage."
see:
<http://www.st.com/internet/com/TECHNICAL_RESOURCES/TECHNICAL_LITERATURE/APPLICATION_NOTE/CD00211314.pdf>
pag 9, I was considering it the worse case error.
gain error?
+-1.5LSB
offset error?
+-1.5LSB
integral nonlinearity?
+-1.5LSB
What about monotonicity or differential linearity?
DNL +-1LSB
See :
<http://www.st.com/internet/com/TECHNICAL_RESOURCES/TECHNICAL_LITERATURE/DATASHEET/CD00161566.pdf>
pag 76
A worst case assumption would be that the ADC is perhaps only
monotonic for the 11 most significant bits.
Fabio.
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