Dear Xinghua,
If you want to get the most out of your data, despite the fact that your data
collection strategy was far from ideal, you may want to use EVAL15
(www.crystal.chem.uu.nl/distr/eval). It it pretty good in modelling the complete
profile, including overlap, and therefore is good at deconvoluting reflections
that may overlap by as much as 60-70%.
Regards,
Loes Kroon-Batenburg
On 05/14/12 04:22, Xinghua Qin wrote:
Dear CCP4ers,
We collected a diffraction dataset with high percentage of spot overlaps, It
would be so kind to tell me how to ignore spot overlap in imosflm and explain
the hazard of high percentage of spot overlaps.
Thanks in advance.
Best wishes
Xinghua Qin
--
Xinghua Qin
State Key Laboratory of Plant Physiology and biochemistry
College of Biological Sciences
China Agricultural University
No.2, Yuan Ming Yuan West Road
Haidian District, Beijing, China 100193
Tel: +86-10-62732672
E-mail:/xinghua...@126.com/ <mailto:xhqin1...@gmail.com>
// <mailto:xhqin1...@gmail.com>
--
__________________________________________
Dr. Loes Kroon-Batenburg
Dept. of Crystal and Structural Chemistry
Bijvoet Center for Biomolecular Research
Utrecht University
Padualaan 8, 3584 CH Utrecht
The Netherlands
E-mail : l.m.j.kroon-batenb...@uu.nl
phone : +31-30-2532865
fax : +31-30-2533940
__________________________________________
