Thanks for the reply. Please find some responses inline.
On Thursday, 19 February 2015 1:50 PM, Bill Williams <b...@cs.wisc.edu>
wrote:
On 02/19/2015 10:25 AM, budchan chao wrote:
> Hi All,
>
> If I understand it correctly Dyninst uses ptrace to connect and modify
> the mutatee. I want to check how much overhead it causes at runtime to
> mutate an instrumentation point. Also I am interested in getting
> overhead of a trampoline at runtime. Are there any existing benchmarks
> for these I can run to get these number? If that's not the case I would
> really appreciate any tips for coming up with these benchmarks being new
> to the project.
Obligatory disclaimer: Dyninst overhead is highly variable depending on
the context in which you're using it and your skill at writing an
efficient mutator. I'm trying to give good general information below; if
you can share a bit about the environment you're working in, I (and the
rest of the list) can provide more focused advice.
It is x86 ELF binaries (GCC) that I am working with.
We've generally used SPECINT/SPECFP as our baseline set of mutatees for
overhead testing. Precise benchmarking of various components of our
instrumentation overhead can require some tweaking of Dyninst internals;
we haven't released any standard benchmarking mutators (that I'm aware
of) recently.
I have several SPECINT (h264 etc.) applications that I am planning to use down
the line for benchmarking with DynInst to get an idea on typical overheads
involved.Any suggestions for good set of benchmark applications which cover
varied runtime behaviors?
You can insert null/no-op instrumentation at your desired
instrumentation points and get a reasonable benchmark of the
springboard/relocation overhead associated with instrumenting those points.
I will try that
> I think for trampoline overhead one I can time call loop for an empty
> function (inlined) with an entry instrumentation. For the first one I
> think measuring elapsed time between processAttach and continueExecution
> would do the trick. Am I correct? Just want to make sure I am thinking
> correctly on this.
>
Calling an empty function with entry instrumentation is going to give
you skewed relative overhead and may or may not give you useful absolute
overhead. Relative overhead will, to a first approximation, be
proportional to the fraction of new instructions added, and most
functions you'd want to instrument in real code are not actually empty.
An empty function is also going to have potentially very different cache
behavior from a real-world function, and the perturbations that
instrumentation causes there will have little to do with the sorts of
perturbations we see in real applications.
This indeed make sense.
There should be some measure of parsing time that's amortized into the
first instrumentation operation on a given DSO in a process. I don't
know how precisely you want to separate parsing, code generation, and
the actual mechanics of inserting a generated binary blob, but what
you're proposing to measure between attach and continue is going to
contain some of each of those.
What if I insert snippet and then somehow remove it (didn't yet see the
APIcalls related removal of snippets at runtime) and re-insert it. Would it
cachethe generated code and just reuse it the second time around. In that caseI
could potentially time that second insertion to leave out the code
generationoverhead?
> Also I was wondering if there was way to do the dynamic instrumentation
> "in-band" if that makes sense. (Like using a separate thread in the same
> process so that there is no need to have a separate mutator process to
> do it.)
There have been various projects in the group over the years that do
in-band (or first-party, as we refer to it) instrumentation. As far as I
know, none of them have taken a separate thread approach. There's also
Dyninst's binary rewriting mode, where the
parsing/codegen/instrumentation process occurs once up-front and then
you run the instrumented binary on its own.
Interesting..
> Regards
> Chan
>
>
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--
--bw
Bill Williams
Paradyn Project
b...@cs.wisc.edu
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