Hi Everyone, The combination of a problem a client of mine had plus a recent news story prompted me to write my latest Technical Tidbit for July about cell phones having the ability to destroy nearby devices such as an automotive "smart key." The title of the article is "Mobile Phone Induced Circuit Failure."
Abstract: Cases of circuit failures caused by mobile, or cell, phones are starting to be reported. A brief overview of the problem is given followed by a simple test procedure to gauge the risk to a product. Go to http://emcesd.com and click on the picture of a car key at the bottom of the page to read the article. Doug -- ___ _ Doug Smith \ / ) P.O. Box 1457 ========= Los Gatos, CA 95031-1457 _ / \ / \ _ TEL/FAX: 408-356-4186/358-3799 / /\ \ ] / /\ \ Mobile: 408-858-4528 | q-----( ) | o | Email: d...@dsmith.org \ _ / ] \ _ / Web: http://www.dsmith.org - This message is from the IEEE Product Safety Engineering Society emc-pstc discussion list. Website: http://www.ieee-pses.org/ To post a message to the list, send your e-mail to emc-p...@ieee.org Instructions: http://listserv.ieee.org/request/user-guide.html List rules: http://www.ieee-pses.org/listrules.html For help, send mail to the list administrators: Scott Douglas emcp...@ptcnh.net Mike Cantwell mcantw...@ieee.org For policy questions, send mail to: Jim Bacher: j.bac...@ieee.org David Heald: emc-p...@daveheald.com All emc-pstc postings are archived and searchable on the web at: http://www.ieeecommunities.org/emc-pstc ______________________________________________________________________ This email has been scanned by the MessageLabs Email Security System. For more information please visit http://www.messagelabs.com/email ______________________________________________________________________
