ok, I will do. Thank you a lot for the suggestions.

Stefano


> On Wed, May 14, 2014 at 03:23:35PM +0200, [email protected] wrote:
>> I have 2.4 nm islands on a flat substrate. I would like to count them as
>> precise as possible with Gwyddion.
>>
>> The procedure I'm following is to mark by threshold the islands and then
>> in statistics check the number of grains.
>>
>> Unfortunately this number is not so precise, by hand i get 134 islands
>> while with Gwyddion  I get 294. The difference is too big. Moreover, if
>> I
>> change just a bit the threshold that number changes a lot.
>>
>> Instead, if I divide the projected area by pi times the square of the
>> mean
>> grain size (as if the grains were circles) I get a more reasonable
>> number.
>>
>> Which method do you suggest?
>
> First, you can try other marking algorithms, such as Mark by Watershed
> and Mark by Edge Detection.  I'm also working on another method, but it
> is not finished yet.
>
> I don't know if you get too many grains due to oversegmentation or
> marking of areas that should not be marked as grains (e.g. small
> few-pixel ‘grains’ caused by noise).  But the currently available
> methods are more prone to the latter.  If this is the case,  you can use
> grain filtering to get rid of the extra grains.
>
> However, the area method may be still more robust.  You can get good
> threshold also from the height distribution or a Minkowski functional
> and, if there is no serious under- or oversegmentation, divide the total
> projected area by the median grain area.  Median will likely to be
> better than mean but you need to export the values for all grains using
> Grains → Distribution, sort them and take the middle value.
>
> Regards,
>
> Yeti
>
>
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Stefano Chiodini, PhD Student
Institute for Nanostructured Materials Studies (ISMN)
National Research Council (CNR)
Via Piero Gobetti 101
I-40129 Bologna
I T A L Y
Phone:++39-051-639-9188
Cell: ++39-3393142341
[email protected]
www.bo.ismn.cnr.it


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