On 12/5/06, Mark Richards <[EMAIL PROTECTED]> wrote: > Dallas had an issue with 18B20, 18S20, 18B20-PAR, and 18S20-PAR devices, > known famously as the "C3" Die problem, some time ago. It is > characterized, as I am told, by repeated 85C readings returned from the > device caused by a failure of the chip to properly POR. The fix > involves issuing an "exit from test mode" command prior to a conversion. > > Reset > issue ROM Command (Skip, Match) > issue 0x64 > > I haven't seen this problem in new stock so perhaps the best fix is to > replace the device in question. However I do cover this in my software > and perhaps 1WFS might, too. > > /m > > Paul Alfille wrote: > > 85 (the AA00 bit pattern) is apparently one of the error modes of the > > chip. We repeat the measurement if it occurs. Then return the value (it > > COULD be correct). I don't know how to improve. Perhaps power issues? > > Purely a guess. > > > > Paul > > > >
Not sure what's going on behind the scenes BUT the error only occurs when I have two separate scripts trying to read the devices BOTH through owserver. -darryl -- http://randomthoughts.vandorp.ca ------------------------------------------------------------------------- Take Surveys. Earn Cash. Influence the Future of IT Join SourceForge.net's Techsay panel and you'll get the chance to share your opinions on IT & business topics through brief surveys - and earn cash http://www.techsay.com/default.php?page=join.php&p=sourceforge&CID=DEVDEV _______________________________________________ Owfs-developers mailing list [email protected] https://lists.sourceforge.net/lists/listinfo/owfs-developers
