Hi

I would like to make a small comment regarding the high temperature XRD. I am using, from time to time, a HTK1200 furnace with a Panalytical Cu tube and Xcelerator. It is working OK, even with a Ge111 in the incident beam. (discrepancies between the programmed temperature and the real one at the surface of the sample can be as high as 50 degrees, and depend upon the conditions, ie. vacuum, etc but that can be easily callibrated).

However, for the HTK furnace one needs to manually adjust -i.e. pressing a button- the position of the sample. I have measured the position of the sample relative to temperature (by using Y2O3 and Rietveld refinement) and found that the sample holder can shift up to 500 microns with the temperature from RT to 1000 degrees C. This shift in the sample position will change the focalisation and the peak shape etc.. So, for those who want to measure XRD patterns function of temperature a control of this parameter (programatically, which should be included in the batch file) would be a plus.
Regards

N. Dragoe


Leopoldo Suescun a écrit :
Dear list members. Thanks a lot for the generous number and comprehensive 
detail of your answers. I'll be able to give my colleague a good summary of 
options. Everyone seemed quite pleased with their own systems, what talks good 
about builders/vendors, but will make it difficult to say which one is better, 
if there is one :-).
Best regards,
Leopoldo
Dr. Leopoldo Suescun Prof. Agr (Assoc. Prof.) de Física Tel: (+598 2) 9290648/9249859
Cryssmat-Lab./DETEMA                             Fax: (+598 2) 9241906
Facultad de Quimica, Universidad de la Republica
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 \__Montevideo, Uruguay

-----Original Message-----
From: Mikko Heikkilä [mailto:mikko.j.heikk...@helsinki.fi] Sent: Tuesday, April 21, 2009 5:38 AM
To: leopo...@fq.edu.uy
Cc: rietveld_l@ill.fr
Subject: Re: powder diffractometers with high temperature attachment

Hello all.

We have an Anton Paar HTK1200N installed to PANalytical X'Pert PRO MPD
with PIXcel detector. Changing between sample stages is easy and fast as
stated before. I'm been measuring mostly thin films in O2, N2, air and
vacuum, but I've also done some powder experiments. So far I've trusted
manufacturers guarantee for temperature readings. Measuring with PIXcel
is generally very fast (at least for powders) but as I've done most of
my measurements in grazing incidence, I've used PIXcel as point detector
which obviously increases the measuring time.

I don't have any experience with ovens from other manufacturers, but
this combination seems to work very well.

Best regards,
Mikko







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