I hope I don’t get shot for this, only 64 kb:

FWHM values of various SRMs:
[cid:image003.jpg@01D0BE01.C2CFD6F0]
Regards,

Jim


James P. Cline
Materials Measurement Science Division
National Institute of Standards and Technology
100 Bureau Dr. stop 8520 [ B113 / Bldg 217 ]
Gaithersburg, MD 20899-8523    USA
jcl...@nist.gov<mailto:jcl...@nist.gov>
(301) 975 5793
FAX (301) 975 5334

From: Fabrizio Guzzetta [mailto:fabrizio.guzze...@gmail.com]
Sent: Tuesday, July 14, 2015 3:24 AM
To: Cline, James Dr.
Cc: Young, Lindsay Kay; rietveld_l@ill.fr
Subject: Re: Obtaining a silicon standard wafer

Thanks Jim for the useful info. I was not aware of this kind of silicon 
standard until now. But can't be polycrystallinity of Silicon a drawback to use 
it as standard? Or is there a way to "purify" a single phase suitable to use as 
standard? I have always found more useful having LaB6 or corundum (whenever 
LaB6 is expensive to find) to use it as standard to compare instrumental peak 
broadening. In some of the Rietveld software I use or I know, also yttria is 
used to determine peak broadening. Which criteria do you use when choosing a 
suitable pxrd standard to compare your unknown? Why?

Thanks for the enlightening discussion.

Fabrizio Guzzetta
Ph.D. student, Dept. Quimica Inorganica y Organica, UJI
Castellon de la Plana
Spain

2015-07-13 19:56 GMT+02:00 Cline, James Dr. 
<james.cl...@nist.gov<mailto:james.cl...@nist.gov>>:
Lindsay,

I’ve seen pressed discs of silicon powder that were supplied with older Philips 
diffractometers, and I understand that PANalytical will presently supply them 
with their new machines.  NIST offers no such standard of silicon in a disc 
format.  But I can suggest that you consider SRM 640e which is supplied as 
powder.  One can mount a specimen of it carefully to obtain high density and a 
flat specimen surface, and then infiltrate the powder bed with silicone based 
liquid resin such as Vacseal.  See:

http://www.2spi.com/catalog/vac/vacleak.shtml

The surface of the compact will darken to a uniform color when the infiltration 
is complete.  This will result in a stable compact with the diffraction 
properties of SRM 640e.

Regards,

Jim


James P. Cline
Materials Measurement Science Division
National Institute of Standards and Technology
100 Bureau Dr. stop 8520 [ B113 / Bldg 217 ]
Gaithersburg, MD 20899-8523    USA
jcl...@nist.gov<mailto:jcl...@nist.gov>
(301) 975 5793
FAX (301) 975 5334

From: rietveld_l-requ...@ill.fr<mailto:rietveld_l-requ...@ill.fr> 
[mailto:rietveld_l-requ...@ill.fr<mailto:rietveld_l-requ...@ill.fr>] On Behalf 
Of Young, Lindsay Kay
Sent: Friday, July 10, 2015 1:28 PM
To: rietveld_l@ill.fr<mailto:rietveld_l@ill.fr>
Subject: Obtaining a silicon standard wafer


Hello Rietvelders -



This is not exactly a data question, but I am sure someone here can help. I am 
looking into purchasing a silicon powder standard wafer for PXRD instrument 
alignment. However, I am not sure where to get one or how much I might expect 
one to cost. My questions to all of you are:



- Do you know where I could purchase this type of standard?

- How much would you expect to pay for one?

- I have been told Gem Dugout makes these, but they may not be around any more. 
Does anyone know what happened to them?



Thank you very much for your help, and I hope you all have a great weekend!



- Lindsay Young

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