Re: China CCC and CE?

2008-03-20 Thread emc-p...@ieee.org
Curt,
 
The main difference is that a major component in your system such as a power
supply or monitor must also be CCC Certified or must have  the component
evaluated separately by the China test house. This can be done by by
submitting an IEC  CB Test Report with China deviations on the component or
tested in-country.
 
You are correct in that for many product categories, the Chinese GB standards
are equivalent to their IEC equivalent standards.
 
Unlike CE which is a self declaration by the manufacturer, getting a CCC
certificate also involves an initial inspection at the factory and yearly
follow-up inspections. 
 
 
Best Regards,
 
Peter

Curt McNamara mcnam...@umn.edu wrote:

Is there any relation between having met CE standards and getting a 
CCC certificate? I am aware many of the CCC tests are based on IEC 
standards.

Curt

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IEEE EMC Soc United Kingdom and Republic of Ireland event at The Open University Campus - Wednesday 26th March 2008

2008-03-20 Thread emc-p...@ieee.org
Everyone

 

Sorry for the late circulation of this notice.  The event is free, but please
note the need to register in advance.

 

Best wishes

 

Brian   

 



-- 

 

IEEE

 

Event Notice. IEEE Electromagnetic Compatibility Soc. UKRI Chapter.

 

You are invited to attend the forthcoming afternoon technical event to be held
at: 

 

The Open University Campus, Milton Keynes.MK7 6AA

 

Event topics: 

Power line communications (PLC, PLT, BPL) and EMC.

Radiated measurements below 30MHz

The newEMC regulations.

 

 

On WednesdayMarch 26th 2008.

 

Event Agenda

Room location:  The Library Room.  Attendees must report to Berrill reception.

 

 

13-15Welcome.  Brian Jones, Chairman IEEE EMC Soc UKRI Chapter.

 

Topic 1.

 

13:20 - 14:00Coexisting with PLT – is it possible?  Peter Kerry,
Consultant.


14:00 - 14:40Developments in BPL Communications Technology.  John Newbury,
The Open University.

 

14:40 - 15:10Refreshment Break.

 

Topic 2.

 

15:10 - 15:50Radiated field strength measurements below 30 MHz.  David
Lauder, University of Hertfordshire.

 

Topic 3.

 

15:50 - 16:30Forthcoming BERR (formerly DTI) expanded guidance on the new
EMC regulations. Brian Jones, Consultant.

 

16:40 End of meeting.

 

 

 

Information available on speakers and talks:

 

Brian Jones, our Chapter Chairman for this year, has as one of his clients The
Department for Business, Enterprise and Regulatory Reform (formerly the DTI). 
He has assisted them in the drafting of expanded guidance of the UK
Regulations SI 2006 No. 3418 which will be published shortly.  This talk will
give an overview of the expected content of the guidance.

 

David Lauder's talk will cover improving the sensitivity of EMC measuring
antennas for the HF band.  David may be remembered from his involvement with
the Hatfield EMC video course from the early 1990's.

 

 

 

The event is an open meeting.  All welcome.  There is no charge for
attendance. 

If you plan to attend you need to register by informing: Roy Ediss

Email;  roy.ed...@ieee.org

 

For registration you will need to provide: 

Name,

Company, (if applicable),

 

 

Book early for the meeting to avoid disappointment. 

 

  

Room Location: The Library Room. Attendees must report to Berrill reception
first.

 

 

Campus Location:  http://www3.open.ac.uk/contact/locations.aspx

 

Car parking is available on-site.  

For travel by rail to Milton Keynes Central station see timetable information
at:http://www.nationalrail.co.uk/

 

 

 

Lunch may be purchased in the cafeteria in the Berrill reception area.

 

We look forward to seeing you on the day. 

 

 

 

Committee. 
Chapter Committee membership and officers, as from the last EMC Soc. UKRI
Chapter AGM on 12th December 2007. 

Officers 
ChairmanBrian Jones  
e...@brianjones.co.uk 
Vice-Chairman   Paul Duxbury 
paul.duxb...@flomerics.co.uk  

TreasurerRoy Ediss 
roy.ed...@ieee.org

SecretaryTony Swainson 
tony.swain...@ieee.org 
Events Secretary  Roy Ediss roy.ed...@ieee.org 
Membership Secretary Tim Haguetim_ha...@ieee.org



Regional Representatives 
Dave AtkinsS.West.   
d...@atkins1.demon.co.uk

Nigel CarterS.East. 
njcar...@qinetiq.com 
Christos Christopoulos E. Midlands
christos.christopou...@nottingham.ac.uk 
Roy EdissS. Central
roy.ed...@ieee.org 
Brian Jones  W. Midlands   North 
e...@brianjones.co.uk 
Hoon Siew   Scotland 
whs...@ieee.org 

Other Committee Members 
Jon Duerrjon.du...@ieee.org 
Adrian Monk   themo...@romanpark.fsnet.co.uk


The UKRI EMC Chapter website can be viewed at  the UK IEEE site, 
http://www.ieee.org.uk/emc.html


Communication by email is preferred, and members are encouraged to update the
IEEE with any email address changes at 
(http://services1.ieee.org/membersvc/coa/intro.htm),  plus their Regional
Representative, the Secretary and the Membership Secretary.

 

 

 

 

Roy Ediss, 
roy.ed...@ieee.org

Ediss Electric
http://www.ediss-electric.com http://www.ediss-electric.com/ 
02380 016542

 

 

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Re: Terminations for PC during emission measurements

2008-03-20 Thread emc-p...@ieee.org
In message 
8fe3816af82d194db98d7451040bd58a0cd...@mer2-excha2.echostar.com, dated 
Thu, 20 Mar 2008, Grasso, Charles charles.gra...@echostar.com 
writes:

Wendy - I strongly recommend you research this more thoroughly. PCs 
have special test requirements (such as active I/O!) that you will need 
to accommodate.

Quite so, but some EMC standards do at least appear to imply that a 
passive load of the correct impedance can stand in for a peripheral.
-- 
OOO - Own Opinions Only. Try www.jmwa.demon.co.uk and www.isce.org.uk
The bankers who've caused the present mess should have our displeasure
impressed on their bare sterns
John Woodgate, J M Woodgate and Associates, Rayleigh, Essex UK

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RE: Terminations for PC during emission measurements

2008-03-20 Thread emc-p...@ieee.org
HI Wendy

Charles is absolutely correct - you need to be careful here.  Historically the
position of the FCC seems to have been that when they say a port is to have a
'load' they mean that the load is to representative of the device.  Not just
in impedance, but it is to also represent the electrical and mechanical
characteristics of the device.  This is also the intent of ANSI C63.4.
Consequently a simple resistive load would not be appropriate.  

Also, realistically speaking, the only way to 'load' a port is to put a real
device on the port (i.e. a parallel port serial port and USB port device
etc.).  Please note that the ITE section of ANSI C63.4 states When a PC is
the EUT and also the host, the minimum functional interface (I/O) ports that
shall be populated by attaching cables, which are terminated in a typical load
of actual usage, include serial, parallel, and USB, where such ports are
available.  Please note the 'load OF ACTUAL USAGE statement.  The fortunate
thing is that you only need to 'load' one of each type port.  The other ports
of the same type can use a cable connected and 'terminated'.

Thanks 

Dennis Ward 

Director of Engineering 

American TCB 

Certification Resource for the Wireless Industry www.atcb.com 

703-847-4700 fax 703-847-6888 

direct - 703-880-4841 

NOTICE: This E-Mail message and any attachment may contain privileged or
company proprietary information. If you received this message in error, please
return to the sender. 


From: emc-p...@ieee.org [mailto:emc-p...@ieee.org] On Behalf Of Grasso, Charles
Sent: 03/20/2008 10:17 AM
To: wendy...@labone.com.sg; emc-p...@ieee.org
Subject: RE: Terminations for PC during emission measurements

Wendy - I strongly recommend you research this more thoroughly.

PCs have special test requirements (such as active I/O!) that you 

will need to accommodate.



From: emc-p...@ieee.org [mailto:emc-p...@ieee.org] On Behalf Of

wendy...@labone.com.sg

Sent: Tuesday, March 18, 2008 5:49 PM

To: emc-p...@ieee.org

Subject: Terminations for PC during emission measurements

Dear All,

ANSI C63.4 states that when testing a computer, its interface I/O are to

be terminated by peripheral or load. 

I am trying to find out the load impedance for parallel, serial, USB,

etc- ports commonly found on a PC. My intention is to terminate the

ports with load rather than actual peripheral to save cost.   If someone

has a 'quicker' and 'cheaper' way to do this, please enlighten me.

Thank you in advance.

Regards, Wendy Nya

-



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RE: Terminations for PC during emission measurements

2008-03-20 Thread emc-p...@ieee.org
Wendy - I strongly recommend you research this more thoroughly.
PCs have special test requirements (such as active I/O!) that you 
will need to accommodate.


From: emc-p...@ieee.org [mailto:emc-p...@ieee.org] On Behalf Of
wendy...@labone.com.sg
Sent: Tuesday, March 18, 2008 5:49 PM
To: emc-p...@ieee.org
Subject: Terminations for PC during emission measurements

Dear All,
ANSI C63.4 states that when testing a computer, its interface I/O are to
be terminated by peripheral or load. 
I am trying to find out the load impedance for parallel, serial, USB,
etc- ports commonly found on a PC. My intention is to terminate the
ports with load rather than actual peripheral to save cost.   If someone
has a 'quicker' and 'cheaper' way to do this, please enlighten me.
Thank you in advance.
Regards, Wendy Nya

-

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March 25 PSES Meeting: Rich Pescatore--The Future of Product Safety Engineering

2008-03-20 Thread emc-p...@ieee.org
IEEE Product Safety Engineering Society , Santa Clara Valley Chapter
Meeting announcment:

Friends and Colleagues,

You won't want to miss this month's meeting as we welcome Rich
Pescatore who will be doing a presentation on the new hazard based
62368 standard!

There is a REVOLUTION taking place in Safety Standards, and here is a
report from the front lines!  The biggest hazard would be to miss this
presentation!

Meeting Date:  Tuesday, March 25, 2008

Dinner:  5:45 - 7:00 p.m.  Socialize with your colleagues and
tonight's speaker at:
El Torito Mexican Restaurant, 2950 Lakeside Drive, Santa Clara, CA
95054  (408-727-4426) -- just two blocks north of the meeting site.
No RSVP required.

Program:  7:00 - 8:30 p.m.  No admission charge.  Open to the public.

Topic:  The Future of Product Safety
They said it couldn't be done - a safety standard built on the
foundation of Hazard-Based Safety Engineering.  But Rich Pescatore is
now leading the international effort to create just such a
hazard-based safety standard. It will be known as IEC 62368, and its
scope will be the Safety of Information and Communication Technology
Equipment and Audio / Video Equipment.
Mr. Pescatore will review the basis, the scope and the goals of this
new standard.  He will share his insight into the challenges being
overcome to make this standard both accurate and useful, and he will
describe the work being done to ensure it will be functional within
the IECEE CB Scheme.

Speaker:  Rich Pescatore
Rich Pescatore has over 35 years of experience in the fields of
Product Safety and Regulations and presently serves as
Hewlett-Packard's Global Product Safety Standards Development and
Certification Manager.  He is
* A Member of the Board of Directors of the IEEE Product Safety
Engineering Society,
* Vice Chairman (and past Chairman) of the Information Technology
Industry Council (ITI) Technical Regulations Committee,
* Head of the US Delegation to the IECEE Certification Management
Committee, and
* Head of the US Delegation to IEC TC 108 and Convener of the
corresponding Working Group developing IEC 62368.
Mr. Pescatore was the recipient of the Edward Lohse Information
Technology Medal for his demonstrated leadership in the development
and promotion of national and international standards. He has been
awarded the IEC 1906 Award for his major contribution in the
promotion of the IECEE CB Scheme.
Mr. Pescatore has a BSEE from California Polytechnic State University
and an MBA from the University of Santa Clara.  He is a Registered
Electrical Engineer in the State of California.

Meeting Site:  Applied Materials, Bowers Café, 3090 Bowers Ave, Santa
Clara, CA 95054 (map:  http://www.scvemc.org/scv2003meetmap.gif )

Chair: Steve Baldwin, steve.bald...@lamrc.com
Vice-Chair: Roberto Pasos, rpa...@elliottlabs.com
Treasurer:  Mark Montrose, mmont...@ix.netcom.com
Secretary: Gary Eldridge, geldri...@apple.com

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Re: China CCC and CE?

2008-03-20 Thread emc-p...@ieee.org
In message e2f07269-948f-4a2c-b173-689cbedba...@umn.edu, dated Thu, 20 
Mar 2008, Curt McNamara mcnam...@umn.edu writes:

Is there any relation between having met CE standards and getting a CCC 
certificate? I am aware many of the CCC tests are based on IEC 
standards.

In some cases. But to give you a *helpful* answer, we would need to know 
which product(s) and which 'CE standards'.
-- 
OOO - Own Opinions Only. Try www.jmwa.demon.co.uk and www.isce.org.uk
The bankers who've caused the present mess should have our displeasure
impressed on their bare sterns
John Woodgate, J M Woodgate and Associates, Rayleigh, Essex UK

-

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Job Opportunity on Long Island

2008-03-20 Thread emc-p...@ieee.org
Forwarded for Mike Catalano, Siemens Energy  Automation

Siemens Job Posting 66010; Compliance Engineer; Hauppauge, NY - The candidate
we are seeking will have a BS in Engineering with a minimum 5 years experience
in approval - certification - regulatory standards work; experience with
hazardous location approvals preferred. In addition the candidate should have
working knowledge of Safety, Code and Quality standards relating to Low
Voltage safety, Hazardous (Classified) Locations, and Electromagnetic
Compatibility (such as: IEC61010-1; NFPA70 NEC500, 505; IEC60079 –series; EN
61000-6-2 and -4; ISO9001/2000; EN13980); 5-10% travel required; Read more and
apply here: https://careers.peopleclick
com/careerscp/client_siemens/external/search.do 

 Best regards,

Mike Catalano

RD Project Manager

 

Siemens Energy  Automation, Inc.

Process Solutions Division (PSD) 

CoC Ultrasonic Flow PIBU

155 Plant Avenue

Hauppauge, NY 11788 USA

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Re: wheeled bin symbol

2008-03-20 Thread emc-p...@ieee.org
Hi Alan,

From EN 50149:2006 you can read that  the line underneath must be:
Quote: The height (h) of the bar shall be the greater of 0.3 a or 1mm.

Where a is the height from bottom of trash bin to the hinge of the lid, 
refer to drawings.

Best regards
Peter


- Original Message - 
From: Alan Shaw as...@napcosecurity.com
To: emc-p...@ieee.org
Sent: Tuesday, March 18, 2008 10:40 PM
Subject: RE: wheeled bin symbol


 I've often wondered why some graphics have a big thick line
 under the bin? I have a page from the OJ dated 13.2.2003 has only a thin
 line underneath that is consistent with document formatting of a section
 break. Therefore, I've never incorporated the line into artwork that
 I've used.



 Alan

 -Original Message-
 From: emc-p...@ieee.org [mailto:emc-p...@ieee.org] On Behalf Of Peter
 Sent: Tuesday, March 18, 2008 5:10 PM
 To: emc-p...@ieee.org
 Subject: Re: wheeled bin symbol

 Hi Brian,

 As many have already stated, you should read EN 50419 standard and of
 course the directive itself.
 However if youre looking for the graphics you might find the below link
 usefull (though not authoritative)

 http://www.conformance.co.uk/logos/wheelie_bin/wheeliebin_logo.php

 Best regards
 Peter


 - Original Message -
 From: Brian O'Connell oconne...@tamuracorp.com
 To: emc-p...@ieee.org
 Sent: Tuesday, March 18, 2008 4:16 PM
 Subject: wheeled bin symbol


 Good People,

 I have noted that the X'd wheeled-bin symbol, as indicated in the
 WEEE directive, is a bit different from the what is used by
 industry.

 Could someone please point me to an authoritative URL to define
 this graphic ?

 Thanks much.

 luck,
 Brian

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