On 30 Sep 2005 at 7:07, Cory Papenfuss wrote: > The cost of silicon per area is very much a nonlinear function. > The probability of having an error in one "device" when they produce a > whole wafer of them increases dramatically as the area of that "device" > increases. Also, when one of these "devices" has an increasingly likely > error, more of the wafer is wasted when it is thrown out.
However image sensors contain relatively large active elements and are largely analogue in response therefore they are less likely affected by silicon defects that may be crippling to very high density circuits. Rob Studdert HURSTVILLE AUSTRALIA Tel +61-2-9554-4110 UTC(GMT) +10 Hours [EMAIL PROTECTED] http://members.ozemail.com.au/~distudio/publications/ Pentax user since 1986, PDMLer since 1998
