Richard: Here is my take. In hi-pot testing a stress voltage is applied but virtually no energy is absorbed so I would not expect any aging effects. The dielectric is expected to continuously hold off the voltage applied. Therefore, one or a hundred tests would be the same.
During a surge test energy is absorbed. Some surge absorbers, particularly MOVs do degrade. There is a noticeable heating effect which must be dissipated or degradation is accelerated. Regards, Fred Townsend DC to Light From: emc-p...@ieee.org [mailto:emc-p...@ieee.org] On Behalf Of Richard Pittenger Sent: Wednesday, June 22, 2011 1:13 PM To: emc-p...@ieee.org Subject: Repeated Hi-Pot Testing - Destructive? Hello Esteemed Group, I have a question concerning repeated hi-pot testing in regard to whether or not it’s destructive. Background: Some electrical components are hi-pot tested before they’re shipped from their manufacturer. In the end-use manufacturing location, some sub-assemblies may be subjected to hi-pot testing, usually as a means to identify issues before the sub-assemblies are installed in the appliance. Then, finally, many safety standards require a production-line hi-pot test when the product is complete and ready to ship. I’m looking for any information available which would help answer the question of whether or not damage is done to the unit by multiple hi-pot tests. Any comments from personal experience would also be welcome. Thanks. Regards, Richard Pittenger Agency Approval Engineer Hobart Food Machines ________________________________ Disclaimer - This email and any files transmitted with it are confidential and contain privileged or copyrighted information. You must not present this message to another party without first gaining permission from the sender. If you are not the intended recipient, you must not copy, print, distribute or use this email or the information contained in it for any purpose other than to notify us. If you received this email in error, please notify the sender immediately and delete this email from your system. We do not guarantee that this email is free from viruses or any other defects although due care has been taken to minimize the risk. - ---------------------------------------------------------------- This message is from the IEEE Product Safety Engineering Society emc-pstc discussion list. To post a message to the list, send your e-mail to <emc-p...@ieee.org> All emc-pstc postings are archived and searchable on the web at http://product-compliance.oc.ieee.org/ Graphics (in well-used formats), large files, etc. can be posted to that URL. Website: http://www.ieee-pses.org/ Instructions: http://listserv.ieee.org/request/user-guide.html List rules: http://www.ieee-pses.org/listrules.html For help, send mail to the list administrators: Scott Douglas <emcp...@radiusnorth.net> Mike Cantwell <mcantw...@ieee.org> For policy questions, send mail to: Jim Bacher <j.bac...@ieee.org> David Heald <dhe...@gmail.com> - ---------------------------------------------------------------- This message is from the IEEE Product Safety Engineering Society emc-pstc discussion list. To post a message to the list, send your e-mail to <emc-p...@ieee.org> All emc-pstc postings are archived and searchable on the web at http://product-compliance.oc.ieee.org/ Graphics (in well-used formats), large files, etc. can be posted to that URL. Website: http://www.ieee-pses.org/ Instructions: http://listserv.ieee.org/request/user-guide.html List rules: http://www.ieee-pses.org/listrules.html For help, send mail to the list administrators: Scott Douglas <emcp...@radiusnorth.net> Mike Cantwell <mcantw...@ieee.org> For policy questions, send mail to: Jim Bacher <j.bac...@ieee.org> David Heald <dhe...@gmail.com>
