Hi,
With regards to size/shape/distribution analysis of  line profiles, the papers 
by Armstrong et al. (2004a,b,c) discusses a Bayesian/Maximum Entropy method, 
that determines these quantities from the line profile data. This can also 
resolve  bimodal distributions from  line profile data.

This method  tests models for shape/size distribution and modal properties 
using Bayesian analysis. The maximum entropy components is a generalisation of 
the approach presented in A. Le Bail and D. Lou?r. J. Appl. Cryst. (1978). 11, 
50-55. It preserves the positivity of the distribution, determines the most 
probable distribution give the line profile data, instrument profile and 
statistical noise.

Recent publications can be found at the following:
http://nvl.nist.gov/pub/nistpubs/jres/109/1/cnt109-1.htm;
Armstrong et al (2004b) chapt.8, in "Diffraction analysis of the microstructure 
of materials", Springer-Verlag, pp.187--227; 
WA5 Armstrong et al. (2004c), http://www.aip.org.au/wagga2004/.

Regards,Nicholas

Dr Nicholas Armstrong
Department of Applied Physics
University of Technology Sydney
PO Box 123 
Broadway NSW 2007

Ph: (+61-2) 9514-2203
Fax: (+61-2) 9514-2219
E-mail: [EMAIL PROTECTED]

----- Original Message -----
From: Armel Le Bail <[EMAIL PROTECTED]>
Date: Sunday, November 21, 2004 11:10 pm

> 
> It is also true that no development has been done for anisotropy. 
> Not yet!
> 
> Well, if all previous works about trying to take account of 
> size/strainanisotropy in the Rietveld method are nothing yet, this 
> allows to
> close the discussion. Let us wait for really serious developments to
> come.
> 
> Armel
> 
>   
> 
> 


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