(1998) 31, 176-180) has been used for anisotropic shape refinements using the MAUD Rietveld codes, on textured samples: Thin Solid Films 450, 2004, 216-221.
daniel
A 11:12 AM 11/22/04 +0300, vous avez écrit :
> > It is also true that no development has been done for anisotropy. Not yet! > > Well, if all previous works about trying to take account of size/strain > anisotropy in the Rietveld method are nothing yet, this allows to > close the discussion. Let us wait for really serious developments to > come.
You not correctly understood me (I would like to believe that not ill-disposed). I said that no development for size anisotropy has been done including "physical" size distributions (like lognormal, etc.) as were done for the isotropic case. For example: Langford, Louer & Scardi, JAC (2000) 33, 964-974 and Popa & Balzar JAC (2002) 35, 338-346. Concerning previous (phenomenological) works trying to take account of strain/size anisotropy in the Rietveld method, I have myself a contribution: "The (hkl) dependence of diffraction-line broadening caused by strain and size for all Laue groups in Rietveld refinement, N. C. Popa, J. Appl. Cryst. (1998) 31, 176-180." Could I be so stupid to say that such kind of works, including mine, are nothing?
Best wishes, Nicolae Popa
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