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• • Re: how to export data in Topas Oscar O
  • RE: how to export data in Topas Ross Williams
  • Re: how to export data in Topas Watier Yves
• fractional occupancy and composition within GSAS Irvin Telepeni
  • Re: fractional occupancy and composition within GSAS Brian Toby
  • RE: fractional occupancy and composition within GSAS Peter Y. Zavalij
• Problems with SEQGSAS Caroline CURFS
  • Re: Problems with SEQGSAS Caroline CURFS
• site occupancy deepti kothari
  • Re: site occupancy Joerg Bergmann
  • RE: site occupancy Leopoldo Suescun
  • RE: site occupancy deepti kothari
• Unsubscribing Ross H Colman
• stop mailing S VENKATESH
  • stop mailing junfang
  • Re: stop mailing Beatriz Cela
  • stop mailing Rocchina . Caivano
• Configuration of PANalytical X'pert Pro Alexandra Seclaman
  • Re: Configuration of PANalytical X'pert Pro Leonid Solovyov
  • RE: Configuration of PANalytical X'pert Pro Alexandra Seclaman
  • RE: Configuration of PANalytical X'pert Pro Leonid Solovyov
  • Re: Configuration of PANalytical X'pert Pro Payzant, E. Andrew
  • Re: Configuration of PANalytical X'pert Pro Van der Lee
• Fwd: post-doc position available Vincent Favre-Nicolin
• expgui on Vista Davide levy
• Workshop BGMN February 2010 registration closed Reinhard Kleeberg
• RIET: Age Concern edition of the Computing Commission and Teaching Commission newsletter Lachlan Cranswick
• software for correcting peak positions in capillary XRD data alortiz
  • RE: software for correcting peak positions in capillary XRD data Yokochi, Alexandre
  • Re: software for correcting peak positions in capillary XRD data Alun J. Carr
• zero-background quartz plates bill . l . reese
  • RE: zero-background quartz plates Mercier, Patrick
  • RE: zero-background quartz plates Kurt Leinenweber
• Finding atomic coordinates for Mg2Sn hexagonal Huy LE-QUOC
• Request of Atomic coordinates of CuAlO2 chuisy
  • Re: Request of Atomic coordinates of CuAlO2 Alan Hewat
• change of my email chuisy
• Calculating Instrumental broadening paramters for GIXRD prasunsc
• Re: [No subject] Leonid Solovyov
• effect of packing density and surface roughness Tony Raftery
• Re: Leonid Solovyov
• Re: LaB6 David L. Bish
• Rigid body in GSAS Irvin Telepeni
• X-Ray Scattering Methods for Characterization of Advanced Materials Workshop - MRS Fall 2009, Boston Ma, December 4 2009 iuliana . cernatescu
• non-bond distances with esd in GSAS/EXGUI chuisy
  • Re: non-bond distances with esd in GSAS/EXGUI Brian H. Toby
• Workshop BGMN February 2010 Reinhard Kleeberg
• Rietveld Neophyte David Weston
  • Re: Rietveld Neophyte Leonid Solovyov
• Single axis diffractometer sisir ray
• beq parameter in TOPAS Academic sisir ray
  • Re: beq parameter in TOPAS Academic Ross H Colman
• Endeavour Stone Rhine
• HT XRD calibration r . m . wilson
  • RE: HT XRD calibration Ian.Madsen
  • Re: HT XRD calibration Mikko Heikkilä
  • Re: HT XRD calibration Payzant, E. Andrew
  • Re : HT XRD calibration Patrick Weisbecker
  • Re: Re : HT XRD calibration Payzant, E. Andrew
  • RE: Re : HT XRD calibration Yokochi, Alexandre
  • Re : Re : HT XRD calibration Patrick Weisbecker
• X'PERT PRO Daniel Chateigner
• Powder Diffraction & Rietveld Refinement School 2010 EVANS I.R.
• Twinning in FullProf Sikolenko Vadim
• Information - Commission for Powder Diffraction (CPD) !!)website Whitfield, Pamela
• Determine bean center for small angle scattering image in Fit2d Yang, Ling
  • RE: Determine bean center for small angle scattering image in Fit2d Peter Khalifah
• PANalytical is looking for a diffractionist! martijn . fransen
• refining the structural parameters selectively prasunsc
  • RE: refining the structural parameters selectively Maxim V. Lobanov
  • Re: RE: refining the structural parameters selectively prasunsc
• MEM analysis software SM
• defect measurement Angel L. Ortiz
  • Re: defect measurement Eduard E. Levin
  • Re: defect measurement Abaasher Mahmoud
• need reprint Murugesan S
• new versions of GSAS & EXPGUI Robert Von Dreele
• Mask for Fit2d Yang, Ling
  • Re: Mask for Fit2d Jon Wright
• plotting sequential fullprof refinement Joost van Duijn
• model based structure refinement muhammad ali
• Asymmetry profile Alex Sinclair
  • Re: Asymmetry profile Leonid Solovyov
• goebel mirror Ludwig Keller
• RE: RIET: Source code for the Uni-tuebingen MEED Maximum Entropy software Lachlan Cranswick
• RIET: Source code for the Uni-tuebingen MEED Maximum Entropy software Lachlan Cranswick
  • RE: RIET: Source code for the Uni-tuebingen MEED Maximum Entropy software Matthew.Rowles
• Negative Equivalent Isotrpic Calculated Values Problem.. Lee Gerrard
  • RE: Negative Equivalent Isotrpic Calculated Values Problem.. Peter Y. Zavalij
• strain broadening using Fullprof Joost van Duijn
• Degree of overlap in pi-pi stacked systems Franz Werner
• XRD data: particle size, cell size etc [email protected]
  • Re: XRD data: particle size, cell size etc Lujun@EKM
  • Re: XRD data: particle size, cell size etc David Lee
• Tube-Tails in Fullprof Gustavo A. Cifredo
• Refinement of spiral magnetic structure from neutron powder diffraction Alexander Barcza
  • Re: Refinement of spiral magnetic structure from neutron powder diffraction Ross H Colman
  • Re: Refinement of spiral magnetic structure from neutron powder diffraction Alexander Barcza
  • Re: Refinement of spiral magnetic structure from neutron powder diffraction Andrew Wills
  • Re: Refinement of spiral magnetic structure from neutron powder diffraction Alexander Barcza
  • Re: Refinement of spiral magnetic structure from neutron powder diffraction Jon Wright
  • Re: Refinement of spiral magnetic structure from neutron powder diffraction Jon Wright
  • Re: Refinement of spiral magnetic structure from neutron powder diffraction Andrew Wills
• Question about Fullprof Yokochi, Alexandre
  • RE: Question about Fullprof Yokochi, Alexandre
• LP factor in the Rietveld refinement xiujun
  • Re: LP factor in the Rietveld refinement Jon Wright
  • RE: LP factor in the Rietveld refinement Ross Williams
  • RE: LP factor in the Rietveld refinement Peter Y. Zavalij
  • AW: LP factor in the Rietveld refinement Hinrichsen, Bernd
  • Re: AW: LP factor in the Rietveld refinement David Lee
  • Re: AW: LP factor in the Rietveld refinement Leonid Solovyov
  • RE: LP factor in the Rietveld refinement Leonid Solovyov
  • RE: LP factor in the Rietveld refinement alortiz
  • RE: LP factor in the Rietveld refinement Leonid Solovyov
  • Re: LP factor in the Rietveld refinement Ross H Colman
  • Re: LP factor in the Rietveld refinement chuisy
  • Re: LP factor in the Rietveld refinement Leonid Solovyov
  • Re: LP factor in the Rietveld refinement alortiz
  • RE: LP factor in the Rietveld refinement Kurt Leinenweber
  • RE: LP factor in the Rietveld refinement Peter Y. Zavalij
  • RE: LP factor in the Rietveld refinement Leonid Solovyov
  • Re: LP factor in the Rietveld refinement Nicolae Popa
  • Re: LP factor in the Rietveld refinement Leonid Solovyov
• .cif file for SnO nrutya gopi
  • Re: .cif file for SnO Leopoldo Suescun
  • Re: .cif file for SnO Alan Hewat
• paper-finished chenhh
• paper chenhh
  • Re: paper Lujun@EKM
  • re:paper chenhh
• Electron density using GSAS: Theoretical Background prasunsc
  • Re: Electron density using GSAS: Theoretical Background David Lee
• Dummy pattern within TOPAS Ross H Colman
  • RE: Dummy pattern within TOPAS Matthew.Rowles
• New ICSD Web version - News from FIZ Karlsruhe Alan Hewat
• [no subject] Mustafa
• Post doctoral position at the Dep. od Structural Chemistry MILANO Angelo Sironi
• synchrotron radiation facility - help Murugesan S
• Source and comparison of X-ray scintillator screens Alan Hewat
  • Re: Source and comparison of X-ray scintillator screens Liang
  • Re: Source and comparison of X-ray scintillator screens Frank Girgsdies
  • RE: Source and comparison of X-ray scintillator screens Leopoldo Suescun
• Mica as standard NIST SRM 675 Anna Llobet
• Cu3Si Crystal structure help Murugesan S
  • Re: Cu3Si Crystal structure help Beatriz Cela
• Crystallographic Computing post at ILL FPSchool
• Rietveld with GSAS A. Bhowmik
  • Re: Rietveld with GSAS Andreas Leineweber
• From TIME MAP to FXYE format tianpeng
  • RE: From TIME MAP to FXYE format Maxim V. Lobanov
  • RE: From TIME MAP to FXYE format tianpeng
• about background substraction wahyu bambang
  • Re: about background substraction David Lee
  • Re: about background substraction Brian H. Toby
  • Re: about background substraction Ross H Colman
  • Re: about background substraction Leonid Solovyov
• DDM update 1.7 Leonid Solovyov
• Introduction and Unit cell parameter determination Gumelar Pritosiwi
  • RE: Introduction and Unit cell parameter determination Leopoldo Suescun
  • Re: Introduction and Unit cell parameter determination Gumelar Pritosiwi
  • Re : Introduction and Unit cell parameter determination Patrick Weisbecker
  • Internal standard Kurt Leinenweber
  • Re: Re : Introduction and Unit cell parameter determination paula vera-cruz
• RIET: Obituary for John Robert (Bob) Carruthers (15 May 1945 - 17 January 2009) Lachlan Cranswick
• Anisotropic strain Ross H Colman
  • Re: Anisotropic strain Andreas Leineweber
  • RE: Anisotropic strain May, Frank
  • Re: Anisotropic strain David Lee
• Course on Software Development for Crystallography, from 15 to 19 June 2009 at ILL (Grenoble, Fance). FPSchool
• Please drop me out of this mailing list, thx! Bo Jiang
• Single crystal data format in FullProf 정재호
• rms of difference ELD in GSAS...? Rohlicek Jan
• Amorphous Materials Nikos Kourkoumelis
  • Re: Amorphous Materials Gabriel Cuello
• grazing angle diffraction in single-crystal Si alortiz
  • Re: grazing angle diffraction in single-crystal Si Eduard E. Levin
  • Re: grazing angle diffraction in single-crystal Si Mikko Heikkilä
  • Re: grazing angle diffraction in single-crystal Si Eduard E. Levin
  • Re: grazing angle diffraction in single-crystal Si Lujun@EKM
  • Re: grazing angle diffraction in single-crystal Si Eduard E. Levin
• changing scattering length of element in Fullprof Anna Llobet
  • Re: changing scattering length of element in Fullprof Andrew Wills
  • RE: changing scattering length of element in Fullprof [SEC=UNCLASSIFIED] AVDEEV, Maxim
• EXPO Stone Rhine
• 10th Canadian Neutron Summer School Swainson, Ian - NRC
• correction: postdoc jobs in nanostructure determination and refinement Simon Billinge
• postdoc jobs in nanostructure determination and refinement Simon Billinge
• powder diffractometers with high temperature attachment Leopoldo Suescun
  • RE: powder diffractometers with high temperature attachment Leenaers Ann
  • Re: powder diffractometers with high temperature attachment David Lee
  • Re: powder diffractometers with high temperature attachment Francois Goutenoire
  • Re: powder diffractometers with high temperature attachment r . m . wilson
  • Re: powder diffractometers with high temperature attachment Mikko Heikkilä
  • Thanks for your kind replies RE: powder diffractometers with high temperature attachment Leopoldo Suescun
  • Re: Thanks for your kind replies RE: powder diffractometers with high temperature attachment Nita DRAGOE
  • Re: Thanks for your kind replies RE: powder diffractometers with high temperature attachment Mikko Heikkilä
• helpandsuggestion chenhh
• New PDFgui release Simon Billinge
• Full exhaustive INDEX.EXE now multithreading enabled Joerg Bergmann

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